| Emergent criticality in complex turing B‐type atomic switch networks AZ Stieg, AV Avizienis, HO Sillin, C Martin‐Olmos, M Aono, JK Gimzewski Advanced Materials 24 (2), 286-293, 2012 | 243 | 2012 |
| Neuromorphic atomic switch networks AV Avizienis, HO Sillin, C Martin-Olmos, HH Shieh, M Aono, AZ Stieg, ... Public Library of Science 7 (8), e42772, 2012 | 213 | 2012 |
| Current, charge, and capacitance during scanning probe oxidation of silicon. I. Maximum charge density and lateral diffusion JA Dagata, F Perez-Murano, C Martin, H Kuramochi, H Yokoyama Journal of applied physics 96 (4), 2386-2392, 2004 | 120 | 2004 |
| Nanolithography on thin layers of PMMA using atomic force microscopy C Martín, G Rius, X Borrisé, F Pérez-Murano Nanotechnology 16 (8), 1016, 2005 | 106 | 2005 |
| Graphene MEMS: AFM probe performance improvement C Martin-Olmos, HI Rasool, BH Weiller, JK Gimzewski ACS nano 7 (5), 4164-4170, 2013 | 104 | 2013 |
| Morphological transitions from dendrites to nanowires in the electroless deposition of silver AV Avizienis, C Martin-Olmos, HO Sillin, M Aono, JK Gimzewski, AZ Stieg Crystal Growth & Design 13 (2), 465-469, 2013 | 66 | 2013 |
| An ultra-fast mechanically active cell culture substrate A Poulin, M Imboden, F Sorba, S Grazioli, C Martin-Olmos, S Rosset, ... Scientific reports 8 (1), 9895, 2018 | 62 | 2018 |
| Current, charge, and capacitance during scanning probe oxidation of silicon. II. Electrostatic and meniscus forces acting on cantilever bending JA Dagata, F Perez-Murano, C Martin, H Kuramochi, H Yokoyama Journal of applied physics 96 (4), 2393-2399, 2004 | 53 | 2004 |
| Measuring electrical current during scanning probe oxidation F Pérez-Murano, C Martın, N Barniol, H Kuramochi, H Yokoyama, ... Applied physics letters 82 (18), 3086-3088, 2003 | 52 | 2003 |
| Self-organized atomic switch networks AZ Stieg, AV Avizienis, HO Sillin, C Martin-Olmos, ML Lam, M Aono, ... Japanese Journal of Applied Physics 53 (1S), 01AA02, 2013 | 48 | 2013 |
| Improved properties of epoxy nanocomposites for specific applications in the field of MEMS/NEMS A Voigt, M Heinrich, C Martin, A Llobera, G Gruetzner, F Pérez-Murano Microelectronic Engineering 84 (5-8), 1075-1079, 2007 | 38 | 2007 |
| Conductivity of SU‐8 Thin Films through Atomic Force Microscopy Nano‐Patterning C Martin‐Olmos, LG Villanueva, PD Van Der Wal, A Llobera, NF De Rooij, ... Advanced Functional Materials 22 (7), 1482-1488, 2012 | 32 | 2012 |
| Self-organization and emergence of dynamical structures in neuromorphic atomic switch networks AZ Stieg, AV Avizienis, HO Sillin, R Aguilera, HH Shieh, C Martin-Olmos, ... Handbook of Memristor Networks, 391-427, 2019 | 31 | 2019 |
| Stress and aging minimization in photoplastic AFM probes C Martin, A Llobera, G Villanueva, A Voigt, G Gruetzner, J Brugger, ... Microelectronic engineering 86 (4-6), 1226-1229, 2009 | 25 | 2009 |
| AFM lithography for the definition of nanometre scale gaps: application to the fabricationof a cantilever-based sensor with electrochemical current detection M Villarroya, F Pérez-Murano, C Martín, Z Davis, A Boisen, J Esteve, ... Nanotechnology 15 (7), 771, 2004 | 25 | 2004 |
| Localized ion implantation through micro/nanostencil masks LG Villanueva, C Martin-Olmos, O Vazquez-Mena, J Montserrat, P Langlet, ... IEEE transactions on nanotechnology 10 (5), 940-946, 2010 | 23 | 2010 |
| Interaction of biomolecules sequentially deposited at the same location using a microcantilever-based spotter N Berthet-Duroure, T Leïchlé, JB Pourciel, C Martin, J Bausells, ... Biomedical Microdevices 10, 479-487, 2008 | 22 | 2008 |
| Resistless fabrication of nanoimprint lithography (NIL) stamps using nano-stencil lithography LG Villanueva, O Vazquez-Mena, C Martin-Olmos, V Savu, K Sidler, ... Micromachines 4 (4), 370-377, 2013 | 19 | 2013 |
| Electron beam lithography at 10 keV using an epoxy based high resolution negative resist C Martin, G Rius, A Llobera, A Voigt, G Gruetzner, F Pérez-Murano Microelectronic engineering 84 (5-8), 1096-1099, 2007 | 18 | 2007 |
| Simple and easily controllable parabolic-shaped microlenses printed on polymeric mesas JY Kim, C Martin-Olmos, NS Baek, J Brugger Journal of Materials Chemistry C 1 (11), 2152-2157, 2013 | 17 | 2013 |
Francesc Perez-MuranoIMB-CNM, CSICEmail được xác minh tại csic.es
