| A new reliability allocation weight for reducing the occurrence of severe failure effects KO Kim, Y Yang, MJ Zuo Reliability Engineering & System Safety 117, 81-88, 2013 | 124 | 2013 |
| General model for the risk priority number in failure mode and effects analysis KO Kim, MJ Zuo Reliability Engineering & System Safety 169, 321-329, 2018 | 119 | 2018 |
| Extending the scope of empirical mode decomposition by smoothing D Kim, KO Kim, HS Oh EURASIP Journal on Advances in Signal Processing 2012, 1-17, 2012 | 49 | 2012 |
| Optimal burn-in for maximizing reliability of repairable non-series systems KO Kim, W Kuo European Journal of Operational Research 193 (1), 140-151, 2009 | 40 | 2009 |
| Optimal allocation of reliability improvement target based on the failure risk and improvement cost KO Kim, MJ Zuo Reliability Engineering & System Safety 180, 104-110, 2018 | 36 | 2018 |
| A relation model of gate oxide yield and reliability KO Kim, W Kuo, W Luo Microelectronics Reliability 44 (3), 425-434, 2004 | 36 | 2004 |
| Percentile life and reliability as performance measures in optimal system design KO Kim, W Kuo IIE Transactions 35 (12), 1133-1142, 2003 | 36 | 2003 |
| Maximization of a percentile life of a series system through component redundancy allocation VR Prasad, W Kuo, KO Kim IIE Transactions 33 (12), 1071-1079, 2001 | 30 | 2001 |
| Some considerations on system burn-in KO Kim, W Kuo IEEE Transactions on Reliability 54 (2), 207-214, 2005 | 24 | 2005 |
| On the relationship of semiconductor yield and reliability KO Kim, MJ Zuo, W Kuo IEEE Transactions on semiconductor manufacturing 18 (3), 422-429, 2005 | 22 | 2005 |
| A general model of heterogeneous system lifetimes and conditions for system burn‐in KO Kim, W Kuo Naval Research Logistics (NRL) 50 (4), 364-380, 2003 | 22 | 2003 |
| Derating design for optimizing reliability and cost with an application to liquid rocket engines KO Kim, T Roh, JW Lee, MJ Zuo Reliability Engineering & System Safety 146, 13-20, 2016 | 19 | 2016 |
| Determining the Importance of Customer Attributes with Kano's Model KMO Kim Journal of Korean Society for Quality Management 35 (4), 38-51, 2007 | 17 | 2007 |
| Burn-in considering yield loss and reliability gain for integrated circuits KO Kim European Journal of Operational Research 212 (2), 337-344, 2011 | 16 | 2011 |
| A unified model incorporating yield, burn‐in, and reliability KO Kim, W Kuo Naval Research Logistics (NRL) 51 (5), 704-719, 2004 | 16 | 2004 |
| Two fault classification methods for large systems when available data are limited KO Kim, MJ Zuo Reliability Engineering & System Safety 92 (5), 585-592, 2007 | 15 | 2007 |
| Optimal number of components in a load-sharing system for maximizing reliability KO Kim Journal of the Korean Statistical Society 47, 32-40, 2018 | 14 | 2018 |
| Effects of manufacturing defects on the device failure rate KO Kim Journal of the Korean Statistical Society 42, 481-495, 2013 | 12 | 2013 |
| Bayesian reliability when system and subsystem failure data are obtained in the same time period KO Kim Journal of the Korean Statistical Society 42 (1), 95-103, 2013 | 10 | 2013 |
| Component and system burn-in for repairable systems KO Kim, W Kuo IIE Transactions 43 (11), 773-782, 2011 | 10 | 2011 |
