个人学术档案

Vishwani Agrawal

professor of electrical engineering

在 eng.auburn.edu 的电子邮件经过验证

被引用次数：17031

vlsi testing low power design

Janusz Rajski

Vice President of Engineering, Siemens

在 mentor.com 的电子邮件经过验证

被引用次数：16467

Electronic Design Automation VLSI Testing Design For Test

Virendra Singh

Associate Professor of Electrical Engineering, Indian Institute of Technology Bombay

在 ee.iitb.ac.in 的电子邮件经过验证

被引用次数：11392

Computer Architecture VLSI Testing Dependable Systems Design Formal Verification

Nur Touba

Professor of Electrical and Computer Engineering, University of Texas at Austin

在 ece.utexas.edu 的电子邮件经过验证

被引用次数：10362

VLSI Testing Fault Tolerance Reliability

Xiaowei Li (李晓维)

Institute of Computing Technology, Chinese Academy of Sciences

在 ict.ac.cn 的电子邮件经过验证

被引用次数：9004

VLSI testing Fault-Tolerant Computing Hardware Security

Shambhu Upadhyaya

Professor of Computer Science and Engineering, University at Buffalo

在 buffalo.edu 的电子邮件经过验证

被引用次数：8799

Computer Security Fault Tolerance VLSI Testing

Cheng-Wen Wu 吳誠文

Department of Electrical Engineering, National Tsing Hua University

在 ee.nthu.edu.tw 的电子邮件经过验证

被引用次数：8772

VLSI Testing Memory Testing Design for Testability

Mehrdad Nourani

University of Texas at Dallas

在 utdallas.edu 的电子邮件经过验证

被引用次数：7014

VLSI Testing Design for Reliability packet processing engines special-purpose system design for biomedical …

Hiroshi Takahashi

Professor, Ehiem UNiversity

在 cs.ehime-u.ac.jp 的电子邮件经过验证

被引用次数：5290

VLSI testing test Fault-tolerant Computing

Sharad Seth

Emeritus Professor

在 cse.unl.edu 的电子邮件经过验证

被引用次数：4924

Document Image Analysis VLSI Testing CMP Cache Management

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