| Design and optimization of multithreshold CMOS (MTCMOS) circuits M Anis, S Areibi, M Elmasry IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2003 | 264 | 2003 |
| Dynamic and leakage power reduction in MTCMOS circuits using an automated efficient gate clustering technique M Anis, M Mahmoud, M Elmasry, S Areibi Proceedings of the 39th annual design automation conference, 480-485, 2002 | 254 | 2002 |
| Energy-efficient noise-tolerant dynamic styles for scaled-down CMOS and MTCMOS technologies MH Anis, MW Allam, MI Elmasry IEEE Transactions on Very Large Scale Integration (VLSI) Systems 10 (2), 71-78, 2002 | 186 | 2002 |
| MOS current mode circuits: analysis, design, and variability H Hassan, M Anis, M Elmasry IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (8), 885-898, 2005 | 179 | 2005 |
| High-speed dynamic logic styles for scaled-down CMOS and MTCMOS technologies MW Allam, MH Anis, MI Elmasry Proceedings of the 2000 international symposium on Low power electronics and …, 2000 | 170 | 2000 |
| Impact of technology scaling on CMOS logic styles M Anis, M Allam, M Elmasry IEEE Transactions on Circuits and Systems II: Analog and Digital Signal …, 2002 | 126 | 2002 |
| Multi-Threshold CMOS Digital Circuits Managing Leakage Power M Anis, M Elmasry optimization 3, 46, 2003 | 109 | 2003 |
| Statistical design of the 6T SRAM bit cell V Gupta, M Anis IEEE Transactions on Circuits and Systems I: Regular Papers 57 (1), 93-104, 2009 | 98 | 2009 |
| Adaptive body bias for reducing the impacts of NBTI and process variations on 6T SRAM cells H Mostafa, M Anis, M Elmasry IEEE Transactions on Circuits and Systems I: Regular Papers 58 (12), 2859-2871, 2011 | 96 | 2011 |
| Nanometer variation-tolerant SRAM: circuits and statistical design for yield MA Rahma, M Anis Springer Science & Business Media, 2012 | 61 | 2012 |
| NBTI and process variations compensation circuits using adaptive body bias H Mostafa, M Anis, M Elmasry IEEE transactions on semiconductor manufacturing 25 (3), 460-467, 2012 | 58 | 2012 |
| A statistical design-oriented delay variation model accounting for within-die variations MH Abu-Rahma, M Anis IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008 | 57 | 2008 |
| Dynamic standby prediction for leakage tolerant microprocessor functional units A Youssef, M Anis, M Elmasry 2006 39th Annual IEEE/ACM International Symposium on Microarchitecture …, 2006 | 57 | 2006 |
| Sustainable development goals under threat? Multidimensional impact of COVID-19 on our planet and society outweigh short term global pollution reduction A Qadeer, M Anis, Z Ajmal, KL Kirsten, M Usman, RR Khosa, M Liu, ... Sustainable Cities and Society 83, 103962, 2022 | 56 | 2022 |
| Statistical thermal profile considering process variations: Analysis and applications J Jaffari, M Anis IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008 | 52 | 2008 |
| Self-aligned double-patterning (SADP) friendly detailed routing M Mirsaeedi, JA Torres, M Anis Design for Manufacturability through Design-Process Integration V 7974, 190-198, 2011 | 49 | 2011 |
| Discrete cooperative particle swarm optimization for FPGA placement M El-Abd, H Hassan, M Anis, MS Kamel, M Elmasry Applied Soft Computing 10 (1), 284-295, 2010 | 49 | 2010 |
| Statistical design framework of submicron flip-flop circuits considering process variations SA Sadrossadat, H Mostafa, M Anis IEEE Transactions on Semiconductor Manufacturing 24 (1), 69-79, 2010 | 47 | 2010 |
| A novel low area overhead direct adaptive body bias (D-ABB) circuit for die-to-die and within-die variations compensation H Mostafa, M Anis, M Elmasry IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (10 …, 2010 | 46 | 2010 |
| Leakage current variability in nanometer technologies M Anis, MH Aburahma Fifth International Workshop on System-on-Chip for Real-Time Applications …, 2005 | 45 | 2005 |
Hassan MostafaEngineering at Cairo University, Zewail City of Science and Technology, University of Toronto在 staff.cu.edu.eg 的电子邮件经过验证