| Identifying combination of defects and unknown defects on semiconductor wafers using deep learning and hierarchical reclustering A Gupta, A Barari, D Damini, KK Jagannathachar, S Lee, J Oh, J Kim, ... 2022 35th International Conference on VLSI Design and 2022 21st …, 2022 | 2 | 2022 |
| Quantile Based Statistical Failure Analysis for Wafer Level Test Comparison J Bae, M Kim, J Lee, M Oak, C Park, S Park, S Yim, H Hong, J Lee International Symposium for Testing and Failure Analysis 84215, 263-268, 2021 | | 2021 |
