| A Low-Cost Fault-Tolerant RISC-V Processor for Space Systems DA Santos, LM Luza, CA Zeferino, L Dilillo, DR Melo 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 1-5, 2020 | 51 | 2020 |
| A Survey on Deep Learning Resilience Assessment Methodologies A Ruospo, E Sanchez, LM Luza, L Dilillo, M Traiola, A Bosio Computer 56 (2), 57-66, 2023 | 40 | 2023 |
| Emulating the effects of radiation-induced soft-errors for the reliability assessment of neural networks LM Luza, A Ruospo, D Söderström, C Cazzaniga, M Kastriotou, ... IEEE Transactions on Emerging Topics in Computing 10 (4), 1867-1882, 2021 | 34 | 2021 |
| Reliability analysis of a fault-tolerant RISC-V system-on-chip DA Santos, LM Luza, L Dilillo, CA Zeferino, DR Melo Microelectronics Reliability 125, 114346, 2021 | 22 | 2021 |
| Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems LM Luza, D Söderström, G Tsiligiannis, H Puchner, C Cazzaniga, ... 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020 | 21 | 2020 |
| Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment D Söderström, LM Luza, H Kettunen, A Javanainen, W Farabolini, ... IEEE Transactions on Nuclear Science 68 (5), 716-723, 2021 | 20 | 2021 |
| Characterization of a RISC-V System-on-Chip under Neutron Radiation DA Santos, LM Luza, M Kastriotou, C Cazzaniga, CA Zeferino, DR Melo, ... 2021 16th International Conference on Design & Technology of Integrated …, 2021 | 13 | 2021 |
| Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks A Ruospo, LM Luza, A Bosio, M Traiola, L Dilillo, E Sanchez 2021 IEEE 22nd Latin American Test Symposium (LATS), 1-5, 2021 | 10 | 2021 |
| Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM LM Luza, D Söderström, H Puchner, RG Alía, M Letiche, A Bosio, L Dilillo 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 1-6, 2020 | 10 | 2020 |
| Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip DA Santos, AMP Mattos, LM Luza, C Cazzaniga, M Kastriotou, DR Melo, ... 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2022 | 8 | 2022 |
| Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices LM Luza, F Wrobel, L Entrena, L Dilillo 2022 IEEE European Test Symposium (ETS), 1-10, 2022 | 8 | 2022 |
| Neutron-induced effects on a self-refresh DRAM LM Luza, D Söderström, H Puchner, RG Alía, M Letiche, C Cazzaniga, ... Microelectronics Reliability 128, 114406, 2022 | 7 | 2022 |
| Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study LM Luza, D Söderström, AMP de Mattos, EA Bezerra, C Cazzaniga, ... 2021 16th International Conference on Design & Technology of Integrated …, 2021 | 6 | 2021 |
| A Model-Based Framework to Assess the Reliability of Safety-Critical Applications LM Luza, A Ruospo, A Bosio, E Sanchez, L Dilillo 2021 24th International Symposium on Design and Diagnostics of Electronic …, 2021 | 6 | 2021 |
| Effects of Heavy Ion and Proton Irradiation on a SLC NAND Flash Memory LM Luza, A Bosser, V Gupta, A Javanainen, A Mohammadzadeh, L Dilillo 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019 | 6 | 2019 |
| A Fault-Tolerant Reconfigurable Platform for Communication Modules of Satellites CA Rigo, LM Luza, ED Tramontin, V Martins, SV Martinez, LK Slongo, ... 2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019 | 3 | 2019 |
| Investigation of Single-Event Effects for Space Applications: Instrumentation for In-Depth System Monitoring AMP Mattos, DA Santos, LM Luza, V Gupta, L Dilillo Electronics 13 (10), 1822, 2024 | 2 | 2024 |
| Investigation on Radiation-Induced Latch-Ups in COTS SRAM Memories On-Board PROBA-V AMP Mattos, DA Santos, LM Luza, V Gupta, T Borel, L Dilillo IEEE Transactions on Nuclear Science, 2024 | 2 | 2024 |
| On the evaluation of FPGA radiation benchmarks G Bricas, G Tsiligiannis, A Touboul, J Boch, M Kastriotou, C Cazzaniga, ... Microelectronics Reliability 126, 114276, 2021 | 2 | 2021 |
| Technology Dependence of Stuck Bits and Single Event Upsets in 110, 72, and 63-nm SDRAMs D Söderström, LM Luza, AMP De Mattos, T Gil, H Kettunen, K Niskanen, ... IEEE Transactions on Nuclear Science, 2023 | 1 | 2023 |
Luigi DililloIES, CNRS, University of Montpellier在 umontpellier.fr 的电子邮件经过验证