A new look at impact ionization-Part I: A theory of gain, noise, breakdown probability, and frequency response

RJ McIntyre - IEEE Transactions on Electron Devices, 1999 - ieeexplore.ieee.org
Impact ionization in thick multiplication regions is adequately described by models in which
the ionization coefficients are functions only of the local electric field. In devices with thin …

A new look at impact ionization-Part II: Gain and noise in short avalanche photodiodes

P Yuan, KA Anselm, C Hu, H Nie… - … on Electron Devices, 1999 - ieeexplore.ieee.org
For Part I see RJ McIntyre, ibid., vol. 46, no. 8, pp. 1623-31 (1999). In Part I, a new theory for
impact ionization that utilizes history-dependent ionization coefficients to account for the …

Impact ionization characteristics of III-V semiconductors for a wide range of multiplication region thicknesses

P Yuan, CC Hansing, KA Anselm… - IEEE journal of …, 2000 - ieeexplore.ieee.org
Recently, an impact ionization model, which takes the nonlocal nature of the impact
ionization process into account, has been described. This model incorporates history …

Avalanche multiplication noise characteristics in thin GaAs p/sup+/-in/sup+/diodes

KF Li, DS Ong, JPR David, GJ Rees… - … on Electron Devices, 1998 - ieeexplore.ieee.org
Avalanche noise measurements have been performed on a range of homojunction GaAs
p/sup+/-in/sup+/and n/sup+/-ip/sup+/diodes with" i" region widths,/spl omega/from 2.61 to …

Thin multiplication region InAlAs homojunction avalanche photodiodes

C Lenox, P Yuan, H Nie, O Baklenov, C Hansing… - Applied physics …, 1998 - pubs.aip.org
Low excess noise in avalanche photodetectors (APDs) is desired for improved sensitivity
and high-frequency performance. Gain and noise characteristics are measured for InAlAs …

Invited Review: Superlattice and multiquantum well avalanche photodetectors: physics, concepts and performance

KF Brennan, II Joe Haralson - Superlattices and microstructures, 2000 - Elsevier
In this paper we review the underlying physical principles behind the workings of
superlattice/multiquantum well avalanche photodiodes (APDs), examine various device …

InGaAs/InAlAs avalanche photodiodes with a high responsivity and multiplication factor using carbon-doped p-InAlAs as the charge layer

C Li, S Qiu, X Ruan, C Liu, Q Cheng - Materials Today Communications, 2024 - Elsevier
An avalanche photodiode (APD) is a widely used device, especially in weak light detection
systems like fiber optic detection. InAlAs is suitable for the fabrication of multiplication and …

A simple model for avalanche multiplication including deadspace effects

SA Plimmer, JPR David, DS Ong… - IEEE Transactions on …, 1999 - ieeexplore.ieee.org
A simple Monte Carlo model (SMC) using single effective parabolic valleys and accurately
accounting for deadspace effects is presented for calculating the avalanche process. Very …

Modeling sources of nonlinearity in a simple pin photodetector

Y Hu, BS Marks, CR Menyuk, VJ Urick… - Journal of Lightwave …, 2014 - ieeexplore.ieee.org
Nonlinearity in pin photodetectors leads to power generation at harmonics of the input
frequency, limiting the performance of RF-photonic systems. We use one-dimensional and …

Resonant-cavity separate absorption, charge and multiplication avalanche photodiodes with high-speed and high gain-bandwidth product

H Nie, KA Anselm, C Lenox, P Yuan… - IEEE Photonics …, 1998 - ieeexplore.ieee.org
Previously, it has been shown that resonant-cavity separate-absorption-and-multiplication
(SAM) avalanche photodiodes (APD's) exhibit high-speed and high gain-bandwidth …