A novel stable zinc–oxo cluster for advanced lithography patterning
Y Si, Y Zhao, G Shi, D Zhou, F Luo, P Chen… - Journal of Materials …, 2023 - pubs.rsc.org
Recently, the development of novel metal-containing resists has received much attention in
extreme ultraviolet lithography (EUVL) owing to their smaller sizes and higher EUV …
extreme ultraviolet lithography (EUVL) owing to their smaller sizes and higher EUV …
Advanced lithography materials: From fundamentals to applications
Y Zhang, H Yu, L Wang, X Wu, J He, W Huang… - Advances in Colloid and …, 2024 - Elsevier
The semiconductor industry has long been driven by advances in a nanofabrication
technology known as lithography, and the fabrication of nanostructures on chips relies on an …
technology known as lithography, and the fabrication of nanostructures on chips relies on an …
Fluorine-rich zinc oxoclusters as extreme ultraviolet photoresists: chemical reactions and lithography performance
The absorption of extreme ultraviolet (EUV) radiation by a photoresist strongly depends on
its atomic composition. Consequently, elements with a high EUV absorption cross section …
its atomic composition. Consequently, elements with a high EUV absorption cross section …
Approaching Angstrom-Scale Resolution in Lithography Using Low-Molecular-Mass Resists (< 500 Da)
Resists that enable high-throughput and high-resolution patterning are essential in driving
the semiconductor technology forward. The ultimate patterning performance of a resist in …
the semiconductor technology forward. The ultimate patterning performance of a resist in …
Recent progress of inorganic photoresists for next-generation EUV lithography
YK Kang, SJ Lee, S Eom, BG Kim… - Journal of Materials …, 2024 - pubs.rsc.org
The continuous scaling down of semiconductor devices has significantly benefited
consumers by enhancing the device performance, portability, power efficiency, and …
consumers by enhancing the device performance, portability, power efficiency, and …
Evolution of patterning materials towards the Moore's Law 2.0 Era
DL Goldfarb - Japanese Journal of Applied Physics, 2022 - iopscience.iop.org
In this paper, the utilization of lithographic materials for semiconductor patterning
applications based on optical and EUV radiation sources is reviewed. Photoresist platforms …
applications based on optical and EUV radiation sources is reviewed. Photoresist platforms …
Layer-ordered organooxotin clusters for extreme-ultraviolet photolithography
S Woo, JH Baek, C Koh, T Nishi… - ACS Applied Materials & …, 2024 - ACS Publications
Extreme-ultraviolet (EUV) photolithography, which enables the high-throughput production
of well-defined patterns with critical dimensions on the scale of several nanometers, is …
of well-defined patterns with critical dimensions on the scale of several nanometers, is …
Theoretical Insights into the Solubility Polarity Switch of Metal–Organic Nanoclusters for Nanoscale Patterning
Q Wang, M Vockenhuber, H Cui, X Wang, P Tao… - Small …, 2023 - Wiley Online Library
Metal–organic nanoclusters (MOCs) are being increasingly used as prospective photoresist
candidates for advanced nanoscale lithography technologies. However, insight into the …
candidates for advanced nanoscale lithography technologies. However, insight into the …
Zn-Ti oxo cluster photoresists for EUV Lithography: Cluster structure and lithographic performance
D Wang, R Xu, D Zhou, J Zhao, J Zhang, P Chen… - Chemical Engineering …, 2024 - Elsevier
Low reflectivity of multilayer mirror–induced low efficiency of existing extreme ultraviolet
lithography (EUVL) has triggered the search for photoresists with heightened sensitivity. For …
lithography (EUVL) has triggered the search for photoresists with heightened sensitivity. For …
Review of metal-containing resists in electron beam lithography: perspectives for extreme ultraviolet patterning
MSM Saifullah, N Tiwale… - Journal of Micro …, 2022 - spiedigitallibrary.org
Background: Metal-containing resists entered the mainstream semiconductor industry
process flow to mitigate the low absorbance of extreme ultraviolet (EUV) radiation by thin …
process flow to mitigate the low absorbance of extreme ultraviolet (EUV) radiation by thin …