A novel stable zinc–oxo cluster for advanced lithography patterning

Y Si, Y Zhao, G Shi, D Zhou, F Luo, P Chen… - Journal of Materials …, 2023 - pubs.rsc.org
Recently, the development of novel metal-containing resists has received much attention in
extreme ultraviolet lithography (EUVL) owing to their smaller sizes and higher EUV …

Advanced lithography materials: From fundamentals to applications

Y Zhang, H Yu, L Wang, X Wu, J He, W Huang… - Advances in Colloid and …, 2024 - Elsevier
The semiconductor industry has long been driven by advances in a nanofabrication
technology known as lithography, and the fabrication of nanostructures on chips relies on an …

Fluorine-rich zinc oxoclusters as extreme ultraviolet photoresists: chemical reactions and lithography performance

N Thakur, M Vockenhuber, Y Ekinci, B Watts… - ACS Materials …, 2022 - ACS Publications
The absorption of extreme ultraviolet (EUV) radiation by a photoresist strongly depends on
its atomic composition. Consequently, elements with a high EUV absorption cross section …

Approaching Angstrom-Scale Resolution in Lithography Using Low-Molecular-Mass Resists (< 500 Da)

MSM Saifullah, AK Rajak, KA Hofhuis, N Tiwale… - ACS …, 2024 - ACS Publications
Resists that enable high-throughput and high-resolution patterning are essential in driving
the semiconductor technology forward. The ultimate patterning performance of a resist in …

Recent progress of inorganic photoresists for next-generation EUV lithography

YK Kang, SJ Lee, S Eom, BG Kim… - Journal of Materials …, 2024 - pubs.rsc.org
The continuous scaling down of semiconductor devices has significantly benefited
consumers by enhancing the device performance, portability, power efficiency, and …

Evolution of patterning materials towards the Moore's Law 2.0 Era

DL Goldfarb - Japanese Journal of Applied Physics, 2022 - iopscience.iop.org
In this paper, the utilization of lithographic materials for semiconductor patterning
applications based on optical and EUV radiation sources is reviewed. Photoresist platforms …

Layer-ordered organooxotin clusters for extreme-ultraviolet photolithography

S Woo, JH Baek, C Koh, T Nishi… - ACS Applied Materials & …, 2024 - ACS Publications
Extreme-ultraviolet (EUV) photolithography, which enables the high-throughput production
of well-defined patterns with critical dimensions on the scale of several nanometers, is …

Theoretical Insights into the Solubility Polarity Switch of Metal–Organic Nanoclusters for Nanoscale Patterning

Q Wang, M Vockenhuber, H Cui, X Wang, P Tao… - Small …, 2023 - Wiley Online Library
Metal–organic nanoclusters (MOCs) are being increasingly used as prospective photoresist
candidates for advanced nanoscale lithography technologies. However, insight into the …

Zn-Ti oxo cluster photoresists for EUV Lithography: Cluster structure and lithographic performance

D Wang, R Xu, D Zhou, J Zhao, J Zhang, P Chen… - Chemical Engineering …, 2024 - Elsevier
Low reflectivity of multilayer mirror–induced low efficiency of existing extreme ultraviolet
lithography (EUVL) has triggered the search for photoresists with heightened sensitivity. For …

Review of metal-containing resists in electron beam lithography: perspectives for extreme ultraviolet patterning

MSM Saifullah, N Tiwale… - Journal of Micro …, 2022 - spiedigitallibrary.org
Background: Metal-containing resists entered the mainstream semiconductor industry
process flow to mitigate the low absorbance of extreme ultraviolet (EUV) radiation by thin …