Machine Learning-Based Compact Modeling of Silicon Cold Source Field-Effect Transistors

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A Bottom-Up Machine-Learning Approach for Efficient Device Simulation

X **e, Y Wang, Z Tang, Y Wang… - IEEE Transactions on …, 2025 - ieeexplore.ieee.org
The combination of machine-learning (ML) and electronic structure computation has proven
effective in studying various properties of molecules and crystals at the atomistic level …
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ANN-Driven Modeling of Gate-All-Around Transistors Incorporating Complete Current Profiles

A Singhal, H Agarwal - IEEE Transactions on Nanotechnology, 2025 - ieeexplore.ieee.org
In this article, we present an Artificial Neural Network (ANN)-based compact model that
accurately captures the complete current characteristics of gate-all-around transistors …
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