Within the complex and competitive semiconductor manufacturing industry, lot cycle time
(CT) remains one of the key performance indicators. Its reduction is of strategic importance …

Advances in sensors, information technology, and high-performance computing have
resulted in massive data sets becoming available in many scientific disciplines. These data …

Semiconductor manufacturing is characterised by a complex production process, advanced
equipment, and volatile demand. Flow time (FT), noted cycle time in semiconductor …

Wafer fabrication is considered the most complex and costly challenge in the
semiconductors industry. Cycle Time (CT), which denotes flow time, is one of its key …

We describe methods for continual prediction of manufactured product quality prior to final
testing. In our most expansive modeling approach, an estimated final characteristic of a …

We describe methods for continual prediction of manufactured product quality prior to final
testing. In our most expansive modeling approach, an estimated final characteristic of a …

A new technique for finding the root cause for problems in a manufacturing process is
presented. The new technique is designated to continuously and automatically detect quality …

We describe an automated system for improving yield, power consumption and speed
characteristics in the manufacture of semiconductors. Data are continually collected in the …

A die-level, predictive defect model is presented which identifies sub-populations of a die
with varying infant mortality. The model is shown to be twice as efficient in identifying …

In this work, we present using random forests statistical learning to analyze post-silicon
delay test data. We introduce the concept of parametric delay test as a new perspective for …