This work reports an on-chip heater structure fabricated in the Front End of Line (FEOL) on a
versatile ring-oscillator (RO) array utilized to conduct statistical characterization of on-chip …

The power battery configuration of an extended-range electric vehicle directly affects the
overall performance of the vehicle. Optimization of the output voltage of the power battery …

Silicon-based Physical Unclonable Functions (PUFs) have become a popular solution to
provide security in many applications. PUFs are circuits that take advantage of the innate …

This paper presents experimental results on the aging-induced degradation of CMOS
current mirrors fabricated in a 65-nm CMOS technology. A dedicated integrated circuit array …

With today's rapid development of novel and advanced technology nodes, transistor
degradation phenomena like BTI and HCI are evolving to an even more serious concern for …

This work presents an integrated circuit array with custom test structures for the
characterization of aging phenomena that includes three types of commonly-used circuits …

In digital circuits, aging phenomena can lead to timing violations due to increased signal
delays suffered by digital cells. An accurate and trustworthy characterization of these …