Rapid progress in CMOS technology since the late 1990s has increased the vulnerability of
processors toward faults. Subsequently, the focus of computer architects has shifted toward …

Smaller transistor sizes and reduction in voltage levels in modern microprocessors induce
higher soft error rates. This trend makes reliability a primary design constraint for computer …

Due to the continuously decreasing feature sizes and the increasing complexity of integrated
circuits, commercial off-the-shelf (COTS) hardware is becoming less and less reliable …

Because of technology scaling, the soft error rate has been increasing in digital circuits,
which affects system reliability. Therefore, modern processors, including VLIW architectures …

During a processor development cycle, post-silicon validation is performed on the first
fabricated chip to detect and fix design errors. Design errors occur due to functional issues …

Reliability is quickly becoming a primary design constraint for high-end processors because
of the inherent limits of manufacturability, extreme miniaturization of transistors, and the …

Despite the numerous benefits that Integrated Circuit (IC) technology downscaling brings, it
also introduces many challenges. First of all, IC dependability is lowering: both lifetime …

Reliability has taken centre stage in the development of high-performance computing
processors. A Surge of interest is noticeable in recent times in formulating fault and failure …

Occurrences of both transient and permanent errors pose a major challenge in the wake of
burgeoning growth in transistor density. Manufacturing defects and process variants lead to …

The embedded system-on-a-chip (SoC), that integrates heterogeneous processors with
variation in coherence protocol, adds complexity in maintaining coherency in the data …