Review on grazing incidence X-ray spectrometry and reflectometry

KN Stoev, K Sakurai - Spectrochimica Acta Part B: Atomic Spectroscopy, 1999 - Elsevier
Grazing incidence X-ray techniques are now widely used for surface and thin film analysis.
The present article overviews the recent advancement since 1993 of the grazing incidence X …

Determination of ultra trace contaminants on silicon wafer surfaces using total-reflection X-ray fluorescence TXRF 'state-of-the-art'

S Pahlke, L Fabry, L Kotz, C Mantler… - Spectrochimica Acta Part B …, 2001 - Elsevier
In a well balanced system of highly motivated, well trained personnel and automated
equipment, pure reagents and bulk media, cleanrooms and integrated data management …

[КНИГА][B] Основы физики рентгеновского излучения

Г Павлинский - 2022 - books.google.com
Изложена теория возникновения характеристического и тормозного рентгеновского
излучения. Обсуждены особенности ряда источников рентгеновского излучения …

Portable total reflection X-ray fluorescence spectrometer for nanogram Cr detection limit

S Kunimura, J Kawai - Analytical chemistry, 2007 - ACS Publications
A portable total reflection X-ray fluorescence spectrometer is presented. The present
spectrometer mainly consists of a 1.5-W X-ray tube, a waveguide type slit, a detector, and a …

Development of a method for direct elemental analysis of lithium ion battery degradation products by means of total reflection X-ray fluorescence

M Evertz, C Lürenbaum, B Vortmann, M Winter… - … Acta Part B: Atomic …, 2015 - Elsevier
A new method using the total reflection X-ray fluorescence (TXRF) technique for the
elemental analysis of lithium ion battery (LIB) degradation products is presented. Here we …

Polychromatic excitation improves detection limits in total reflection X-ray fluorescence analysis compared with monochromatic excitation

S Kunimura, J Kawai - Analyst, 2010 - pubs.rsc.org
Detection limits obtained by a portable total reflection X-ray fluorescence (TXRF)
spectrometer with or without a monochromator are compared. A 1 W X-ray tube (tube …

Total-reflection X-ray fluorescence moving towards nanoanalysis: a survey

R Klockenkämper, A Von Bohlen - Spectrochimica Acta Part B: Atomic …, 2001 - Elsevier
Within the last 20 years, total-reflection X-ray fluorescence (TXRF) has been applied to solve
a lot of analytical problems. It turned out that TXRF gives an actual approach to …

Synchrotron radiation-induced total reflection X-ray fluorescence analysis

F Meirer, A Singh, P Pianetta, G Pepponi… - TrAC Trends in …, 2010 - Elsevier
Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a
high sensitive analytical technique that offers limits of detection in the femtogram range for …

Wavelength-Dispersive Total-Reflection X-ray Fluorescence with an Efficient Johansson Spectrometer and an Undulator X-ray Source:  Detection of 10-16 g-Level …

K Sakurai, H Eba, K Inoue, N Yagi - Analytical chemistry, 2002 - ACS Publications
The present paper reports significant enhancement of the detection power for total-reflection
X-ray fluorescence (TXRF). The employment of an efficient wavelength-dispersive …

Trace elemental analysis of commercial bottled drinking water by a portable total reflection X-ray fluorescence spectrometer

S Kunimura, J Kawai - Analytical Sciences, 2007 - Springer
A portable total reflection X-ray fluorescence spectrometer was applied to commercial
bottled drinking water containing 62 ppb (μg/L) V, 7.5 ppm (mg/L) Ca, and 1 ppm K. A dry …