EMI filter robustness in three-level active neutral-point-clamped inverter

Z Shen, M Chen, H Wang, X Wang… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
The electromagnetic interference (EMI) filter is a critical component for power electronics to
conform with the EMI standards, ensuring electromagnetic compatibility and a safe operating …

[PDF][PDF] Digital Active EMI Filter for Smart Electronic Power Converters

M Darisi, T Caldognetto, D Biadene, M Stellini - Electronics, 2024 - researchgate.net
Electronic power converters are widespread and crucial components in modern energy
scenarios. Beyond mere electrical energy conversion, their electronic structure allows …

Machine learning and emi for mosfet aging diagnosis

CMA Taleb, JBH Slama, O Nasri… - 2023 5th Global Power …, 2023 - ieeexplore.ieee.org
MOSFETs play a key role in static power converters, where power MOSFETs operate at high
switching frequencies and are susceptible to Electromagnetic Interference (EMI) due to …

Thermally triggered SiC MOSFET aging effect on conducted EMI

S Pu, E Ugur, F Yang, C Xu… - 2018 IEEE 6th Workshop …, 2018 - ieeexplore.ieee.org
In this paper, thermally triggered SiC MOSFET aging effect on SiC based boost PFC
converter's conducted EMI is investigated. Existing EMI evaluation and suppression studies …

A methodology to analyze and evaluate the uncertainty propagation due to temperature and frequency and design optimization for emc testing instrumentation

M Bosi, AM Sánchez, FJ Pajares, L Peretto - Electricity, 2021 - mdpi.com
This paper presents a study and proposes a new methodology to analyze, evaluate and
reduce the overall uncertainty of instrumentations for EMC measurements. For the scope of …

Investigation of SiC MOSFET Aging Effects on Common-Mode EMI Emissions

TI Mannan, A Amin, S Choi - 2023 IEEE Electric Ship …, 2023 - ieeexplore.ieee.org
This paper uniquely investigates the impact of SiC MOSFET aging on common-mode (CM)
electromagnetic interference (EMI) emissions. SiC MOSFETs have been widely used in high …

Radiated EMI evolution of power SiC MOSFET in a boost converter after short-circuit aging tests

S Douzi, M Kadi, H Boulzazen, M Tlig… - Microelectronics …, 2019 - Elsevier
Increasing power density, faster switching speed and higher switching frequency force
designers to spend more time both considering the effect of Electromagnetic Interferences …

Simulation of conducted EMI in SiC MOSFET buck converters before and after aging

S Douzi, M Tlig, JBH Slama… - 2016 7th International …, 2016 - ieeexplore.ieee.org
Because of switching conditions, the SiC MOSFET (Silicon Carbide MOSFET) always
remains a critical device in static converters. Its reliability is still a challenge which requires …

Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests

S Douzi, M Kadi, H Boulzazen, M Tlig… - Microelectronics …, 2018 - Elsevier
The electromagnetic compatibility (EMC) study is an indispensable step in the development
cycle of power system modules. In power applications using normally off transistors, short …

Verification Scheme and System Design of Charging Pile Electric Energy Measurement

X Li, L Li, X Liu, G Yang, Q Zhou - IOP Conference Series: Earth …, 2019 - iopscience.iop.org
Abstract Design a charging pile electric energy verification device to improve the electric
energy measurement accuracy of the charging pile. The device is mainly used for detecting …