This paper presents a compression/decompression scheme based on selective Huffman
coding for reducing the amount of test data that must be stored on a tester and transferred to …

This paper presents a new compression method for embedded core-based system-on-a-
chip test. In addition to the new compression method, this paper analyzes the three test data …

We present a test resource partitioning (TRP) technique that simultaneously reduces test
data volume, test application time, and scan power. The proposed approach is based on the …

This paper presents a new test-data compression technique that uses exactly nine
codewords. Our technique aims at precomputed data of intellectual property cores in system …

Proposes a new test data compression/decompression method for systems-on-a-chip. The
method is based on analyzing the factors that influence test parameters: compression ratio …

We present a dictionary-based test data compression approach for reducing test data
volume and testing time in SOCs. The proposed method is based on the use of a small …

Among the post-CMOS technologies currently under investigation, quantum computing (QC)
holds a special place. QC offers not only extremely small size and low power, but also …

We present a dictionary-based test data compression approach for reducing test data
volume in SOCs. The proposed method is based on the use of a small number of ATE …

One of the major challenges in testing a system-on-a-chip is dealing with the large volume of
test data. To reduce the volume of test data, several test data compression techniques have …

One of the major challenges in testing a system-on-a-chip (SOC) is dealing with the large
test data size. To reduce the volume of test data, several test data compression techniques …