The Major Effect of Trapped Charge on Dielectric Breakdown Dynamics and Lifetime Estimation

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From Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO2 and HfO2 Stacks

S Vecchi, A Padovani, P Pavan… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
Despite the various well-established theories such as the thermochemical (E-model), E-
model, power law (VN-model), and 1/E-model, accurately replicate dielectric breakdown …
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