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Design of a stable single sided 11t static random access memory cell with improved critical charge
Radiation‐induced soft errors are becoming a key challenge in satellite‐based
communication. The worst‐hit component of such devices is static random‐access memory …
communication. The worst‐hit component of such devices is static random‐access memory …
Unity ECC: Unified memory protection against bit and chip errors
DRAM vendors utilize On-Die Error Correction Codes (OD-ECC) to correct random bit errors
internally. Meanwhile, system companies utilize Rank-Level ECC (RL-ECC) to protect data …
internally. Meanwhile, system companies utilize Rank-Level ECC (RL-ECC) to protect data …
Half-select free bit-line sharing 12T SRAM with double-adjacent bits soft error correction and a reconfigurable FPGA for low-power applications
This work presents a half-select free 12T SRAM cell with Data-Dependent Feedback Cutting
approach to improve the write ability and isolated read path to enhance the read stability …
approach to improve the write ability and isolated read path to enhance the read stability …
A reliable, multi-bit error tolerant 11T SRAM memory design for wireless sensor nodes
The work proposes an 11T SRAM cell which confirms its reliability for Internet of Things (IoT)
based health monitoring system. The cell executes improved write and read ability using …
based health monitoring system. The cell executes improved write and read ability using …
Characterization of stable 12T SRAM with improved critical charge
With the aggressive growth of the internet of things-based applications in the domestic and
industrial domain, the embedded static memory is also under renovation stage to eliminate …
industrial domain, the embedded static memory is also under renovation stage to eliminate …
A Triple Burst Error Correction Based on Region Selection Code
The evolution of microelectronics boosts more scalable and complex circuit designs,
providing high processing speed and greater storage capacity. However, reliability issues …
providing high processing speed and greater storage capacity. However, reliability issues …
Efficient implementations of 4-bit burst error correction for memories
In recent years, there has been a growing interest in error correction codes (ECCs) that can
correct localized errors in memories. This is due to the larger fraction of radiation induced …
correct localized errors in memories. This is due to the larger fraction of radiation induced …
Improve the reliability of 6G vehicular communication through skip network coding
One important design goal of 6G networks is adapting to complex heterogeneous scenarios
and providing a stable and reliable transmission channel for specific applications such as …
and providing a stable and reliable transmission channel for specific applications such as …
SEC-BADAEC: An efficient ECC with no vacancy for strong memory protection
Shrinking process technology and rising memory densities have made memories
increasingly vulnerable to errors. Accordingly, DRAM vendors have introduced On-die Error …
increasingly vulnerable to errors. Accordingly, DRAM vendors have introduced On-die Error …
A multi-bit error upset immune 12T SRAM cell for 5G satellite communications
Satellite communication plays a vital role in extending 5G cellular networks to hard-to-reach
areas, including airplanes, railways, shipments, other transport mechanisms, and especially …
areas, including airplanes, railways, shipments, other transport mechanisms, and especially …