Survey of stochastic computing

A Alaghi, JP Hayes - ACM Transactions on Embedded computing …, 2013 - dl.acm.org
Stochastic computing (SC) was proposed in the 1960s as a low-cost alternative to
conventional binary computing. It is unique in that it represents and processes information in …

The logic of random pulses: Stochastic computing

A Alaghi - 2015 - search.proquest.com
Recent developments in the field of electronics have produced nano-scale devices whose
operation can only be described in probabilistic terms. In contrast with the conventional …

Detection and diagnosis of single faults in quantum circuits

D Bera - IEEE Transactions on Computer-Aided Design of …, 2017 - ieeexplore.ieee.org
Detection and isolation of faults is a crucial step in the physical realization of quantum
circuits. Even though quantum gates and circuits compute reversible functions, the standard …

Detection and diagnosis of faulty quantum circuits

A Paler, I Polian, JP Hayes - 17th Asia and South Pacific …, 2012 - ieeexplore.ieee.org
A new approach to detecting and diagnosing faults in quantum circuits is introduced. In
order to account for the probabilistic nature of quantum circuits, collections of test …

Test and reliability challenges for approximate circuitry

I Polian - IEEE Embedded Systems Letters, 2017 - ieeexplore.ieee.org
As it becomes more and more evident that approximate computing (AC) is a key enabler for
next-generation computer architectures, physical realization of AC systems is gaining in …

A comprehensive fault diagnosis technique for reversible logic circuits

B Mondal, P Das, P Sarkar, S Chakraborty - Computers & Electrical …, 2014 - Elsevier
Fault diagnosis is a complex and challenging problem in reversible logic circuits. The paper
proposes a novel fault diagnosis technique for missing control faults in reversible logic …

Introducing uncertainty into pattern discovery in temporal event sequences

X Sun, ME Orlowska, X Li - Third IEEE International …, 2003 - ieeexplore.ieee.org
Pattern discovery in temporal event sequences is of great importance in many application
domains, such as telecommunication network fault analysis. In reality, not every type of …

Improved fault diagnosis for reversible circuits

H Zhang, R Wille, R Drechsler - 2011 Asian Test Symposium, 2011 - ieeexplore.ieee.org
Reversible circuits rely on an entirely different computing paradigm allowing to perform
computations not only from the primary inputs to the primary outputs but also vice versa …

High efficiency and low overkill testing for probabilistic circuits

MT Lee, CH Wu, ST Liu, CY Hsieh… - 2020 IEEE International …, 2020 - ieeexplore.ieee.org
Probabilistic circuits are a potential solution for low power designs which trade off
correctness for power consumption. The behavior of probabilistic circuits are more …

ATPG and Test Compression for Probabilistic Circuits

KC Yang, MT Lee, CH Wu… - … Symposium on VLSI …, 2019 - ieeexplore.ieee.org
Unlike testing deterministic circuits, where each test pattern is applied only once, testing
probabilistic circuits requires multiple pattern repetitions for each test pattern. In this paper …