The aim of this review paper is to describe in a comprehensive manner the current
understanding of the radiation response of state-of-the-art Silicon-on-Insulator (SOI) and …

Trends in terrestrial neutron-induced soft-error in SRAMs from a 250 nm to a 22 nm process
are reviewed and predicted using the Monte-Carlo simulator CORIMS, which is validated to …

Advances in microelectronics performance and density continue to be fueled by the engine
of Moore's law. Although lately this engine appears to be running out of steam, recent …

This paper presents the impact of new microprocessor technology on microprocessor soft
error rate (SER). The results are based on Oracle's (formerly Sun Microsystems) neutron …

An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …

The history of integrated circuit (IC) development is another record of human challenges
involving space. Efforts have been made to protect ICs from sudden malfunctions due to …

Exposure to radiation poses significant challenges for electronic devices, including
parametric degradation, loss of data, or catastrophic failure. The challenges and solutions …

There is an invisible enemy that constantly threatens the operation of electronics: ionizing
radiation. From sea level to outer space, ionizing radiation is virtually everywhere. At sea …

Low-and high-energy proton experimental data and error rate predictions are presented for
many bulk Si and SOI circuits from the 20-90 nm technology nodes to quantify how much low …

Soft errors are a multifaceted issue at the crossroads of applied physics and engineering
sciences. Soft errors are by nature multiscale and multiphysics problems that combine not …