Recent advances and trends in Cu–Cu hybrid bonding

JH Lau - IEEE Transactions on Components, Packaging and …, 2023‏ - ieeexplore.ieee.org
In this study, the recent advances and trends in Cu–Cu hybrid bonding will be investigated.
Emphasis is placed on the definition, kinds, advantages and disadvantages, challenges …

Recent advances and new trends in flip chip technology

JH Lau - Journal of Electronic Packaging, 2016‏ - asmedigitalcollection.asme.org
Recent advances in flip chip technology such as wafer bum**, package substrate, flip chip
assembly, and underfill will be presented in this study. Emphasis is placed on the latest …

Overview and outlook of through‐silicon via (TSV) and 3D integrations

JH Lau - Microelectronics International, 2011‏ - emerald.com
Purpose–The purpose of this paper is to focus on through‐silicon via (TSV), with a new
concept that every chip or interposer could have two surfaces with circuits. Emphasis is …

Evolution, challenge, and outlook of TSV, 3D IC integration and 3D silicon integration

JH Lau - … symposium on advanced packaging materials (APM), 2011‏ - ieeexplore.ieee.org
3D integration consists of 3D IC packaging, 3D IC integration, and 3D Si integration. They
are different and in general the TSV (through-silicon via) separates 3D IC packaging from …

Polymer integration for packaging of implantable sensors

Y Qin, MMR Howlader, MJ Deen, YM Haddara… - Sensors and Actuators B …, 2014‏ - Elsevier
Abstract Inexpensive, easy-to-process, light-weight polymer-based materials that are
biocompatible, mechanically flexible, and optically transparent have emerged as …

Nanocrystalline copper for direct copper-to-copper bonding with improved cross-interface formation at low thermal budget

C He, J Zhou, R Zhou, C Chen, S **g, K Mu… - Nature …, 2024‏ - nature.com
Direct copper-to-copper (Cu-Cu) bonding is a promising technology for advanced electronic
packaging. Nanocrystalline (NC) Cu receives increasing attention due to its unique ability to …

TSV manufacturing yield and hidden costs for 3D IC integration

JH Lau - 2010 Proceedings 60th electronic components and …, 2010‏ - ieeexplore.ieee.org
3D integration consists of 3D IC packaging, 3D IC integration, and 3D Si integration. They
are different and in general, the TSV (through-silicon-via) separates the 3D IC packaging …

Materials, processing and reliability of low temperature bonding in 3D chip stacking

L Zhang, Z Liu, SW Chen, Y Wang, WM Long… - Journal of Alloys and …, 2018‏ - Elsevier
Due to the advantages of small form factor, high performance, low power consumption, and
high density integration, three-dimensional integrated circuits (3D ICs) have been generally …

Plasma-activated silicon–glass high-strength multistep bonding for low-temperature vacuum packaging

M Yu, L Zhao, Y Wang, Y **a, Y Ma, Y Wang… - Chemical Engineering …, 2023‏ - Elsevier
Si-glass bonding is one of the most crucial vacuum packaging methods in semiconductor
devices; however, high temperatures (> 300° C) are required to achieve a high bonding …

Impact of crystalline orientation on Cu–Cu solid-state bonding behavior by molecular dynamics simulations

H Tatsumi, CR Kao, H Nishikawa - Scientific Reports, 2023‏ - nature.com
High-density electronics are hindered by the constraints of Sn-based solder joints,
necessitating the exploration of Cu–Cu solid-state bonding. However, current bonding …