Trends in photoresist materials for extreme ultraviolet lithography: A review

X Wang, P Tao, Q Wang, R Zhao, T Liu, Y Hu, Z Hu… - Materials Today, 2023 - Elsevier
With the development of microelectronics, the demand for continuously miniaturized feature
sizes has driven continuous progress in lithography technology. Extreme ultraviolet (EUV) …

Organometallic and coordinative photoresist materials for EUV lithography and related photolytic mechanisms

G Lim, K Lee, S Choi, HJ Yoon - Coordination Chemistry Reviews, 2023 - Elsevier
Sub-10 nm patterning with extreme ultraviolet (EUV) light is receiving immediate attention as
a next-generation nanolithography technique, but photoresist materials optimized to EUV …

[HTML][HTML] High sensitivity resists for EUV lithography: a review of material design strategies and performance results

T Manouras, P Argitis - Nanomaterials, 2020 - mdpi.com
The need for decreasing semiconductor device critical dimensions at feature sizes below the
20 nm resolution limit has led the semiconductor industry to adopt extreme ultra violet (EUV) …

Review of recent advances in inorganic photoresists

C Luo, C Xu, L Lv, H Li, X Huang, W Liu - RSC advances, 2020 - pubs.rsc.org
The semiconductor industry has witnessed a continuous decrease in the size of logic,
memory and other computer chip components since its birth over half a century ago. The …

Recent developments in photoresists for extreme-ultraviolet lithography

CK Ober, F Käfer, C Yuan - Polymer, 2023 - Elsevier
This report describes recent developments and current needs in the field of high-resolution
photopolymers and photomolecules briefly describing prior generation lithographic …

Advanced lithography materials: From fundamentals to applications

Y Zhang, H Yu, L Wang, X Wu, J He, W Huang… - Advances in Colloid and …, 2024 - Elsevier
The semiconductor industry has long been driven by advances in a nanofabrication
technology known as lithography, and the fabrication of nanostructures on chips relies on an …

Key role of very low energy electrons in tin-based molecular resists for extreme ultraviolet nanolithography

I Bespalov, Y Zhang, J Haitjema… - … applied materials & …, 2020 - ACS Publications
Extreme ultraviolet (EUV) lithography (13.5 nm) is the newest technology that allows high-
throughput fabrication of electronic circuitry in the sub-20 nm scale. It is commonly assumed …

Sulfonium-functionalized polystyrene-based nonchemically amplified resists enabling sub-13 nm nanolithography

Z Wang, J Chen, T Yu, Y Zeng, X Guo… - … Applied Materials & …, 2022 - ACS Publications
Nonchemically amplified resists based on triphenyl sulfonium triflate-modified polystyrene
(PSTS) were prepared by a facile method of modification of polystyrene with sulfonium …

Multinuclear tin-based macrocyclic organometallic resist for EUV photolithography

G Lim, K Lee, C Koh, T Nishi, HJ Yoon - ACS Materials Au, 2024 - ACS Publications
We report a new photoresist based on a multinuclear tin-based macrocyclic complex and its
performance for extreme UV (EUV) photolithography. The new photoresist has a trinuclear …

A novel stable zinc–oxo cluster for advanced lithography patterning

Y Si, Y Zhao, G Shi, D Zhou, F Luo, P Chen… - Journal of Materials …, 2023 - pubs.rsc.org
Recently, the development of novel metal-containing resists has received much attention in
extreme ultraviolet lithography (EUVL) owing to their smaller sizes and higher EUV …