The roles of structural imperfections in InGaN-based blue light-emitting diodes and laser diodes

S Nakamura - Science, 1998 - science.org
REVIEW High-efficiency light-emitting diodes emitting amber, green, blue, and ultraviolet
light have been obtained through the use of an InGaN active layer instead of a GaN active …

Substrates for gallium nitride epitaxy

L Liu, JH Edgar - Materials Science and Engineering: R: Reports, 2002 - Elsevier
In this review, the structural, mechanical, thermal, and chemical properties of substrates
used for gallium nitride (GaN) epitaxy are compiled, and the properties of GaN films …

[LIBRO][B] Handbook of nitride semiconductors and devices, Materials Properties, Physics and Growth

H Morkoį - 2009 - books.google.com
The three volumes of this handbook treat the fundamentals, technology and nanotechnology
of nitride semiconductors with an extraordinary clarity and depth. They present all the …

Wafer-scale synthesis of monolayer WS2 for high-performance flexible photodetectors by enhanced chemical vapor deposition

C Lan, Z Zhou, Z Zhou, C Li, L Shu, L Shen, D Li… - Nano Research, 2018 - Springer
Abstract Two-dimensional (2D) nanomaterials have recently attracted considerable attention
due to their promising applications in next-generation electronics and optoelectronics. In …

Wet etching of GaN, AlN, and SiC: a review

D Zhuang, JH Edgar - Materials Science and Engineering: R: Reports, 2005 - Elsevier
The wet etching of GaN, AlN, and SiC is reviewed including conventional etching in
aqueous solutions, electrochemical etching in electrolytes and defect-selective chemical …

Characteristics of InGaN-based UV/blue/green/amber/red light-emitting diodes

T Mukai, M Yamada, S Nakamura - Japanese Journal of Applied …, 1999 - iopscience.iop.org
Highly efficient light-emitting diodes (LEDs) emitting ultraviolet (UV), blue, green, amber and
red light have been obtained through the use of InGaN active layers instead of GaN active …

Role of threading dislocation structure on the x‐ray diffraction peak widths in epitaxial GaN films

B Heying, XH Wu, S Keller, Y Li, D Kapolnek… - Applied physics …, 1996 - pubs.aip.org
In this letter we demonstrate that the anomalously low (002) x‐ray rocking curve widths for
epitaxial hexagonal GaN films on (001) sapphire are a result of a specific threading …

Scattering of electrons at threading dislocations in GaN

NG Weimann, LF Eastman, D Doppalapudi… - Journal of Applied …, 1998 - pubs.aip.org
A model to explain the observed low transverse mobility in GaN by scattering of electrons at
charged dislocation lines is proposed. Filled traps along threading dislocation lines act as …

[LIBRO][B] Heteroepitaxy of semiconductors: theory, growth, and characterization

JE Ayers, T Kujofsa, P Rago, J Raphael - 2016 - taylorfrancis.com
In the past ten years, heteroepitaxy has continued to increase in importance with the
explosive growth of the electronics industry and the development of a myriad of …

Mosaic structure in epitaxial thin films having large lattice mismatch

V Srikant, JS Speck, DR Clarke - Journal of Applied Physics, 1997 - pubs.aip.org
Epitaxial films having a large lattice mismatch with their substrate invariably form a mosaic
structure of slightly misoriented sub-grains. The mosaic structure is usually characterized by …