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Power Electronic Semiconductor Materials for Automotive and Energy Saving Applications – SiC, GaN, Ga2O3, and Diamond
PJ Wellmann - Zeitschrift für anorganische und allgemeine …, 2017 - Wiley Online Library
Power electronics belongs to the future key technologies in order to increase system
efficiency as well as performance in automotive and energy saving applications. Silicon is …
efficiency as well as performance in automotive and energy saving applications. Silicon is …
Status and prospects of cubic silicon carbide power electronics device technology
Wide bandgap (WBG) semiconductors are becoming more widely accepted for use in power
electronics due to their superior electrical energy efficiencies and improved power densities …
electronics due to their superior electrical energy efficiencies and improved power densities …
[HTML][HTML] Extended defects in 3C-SiC: Stacking faults, threading partial dislocations, and inverted domain boundaries
The presence of extended bi-dimensional defects is one of the key issues that hinder the
use of wide band-gap materials hetero-epitaxially grown on silicon. In this work, we …
use of wide band-gap materials hetero-epitaxially grown on silicon. In this work, we …
[HTML][HTML] Al2O3 Layers Grown by Atomic Layer Deposition as Gate Insulator in 3C-SiC MOS Devices
Metal-oxide-semiconductor (MOS) capacitors with Al2O3 as a gate insulator are fabricated
on cubic silicon carbide (3C-SiC). Al2O3 is deposited both by thermal and plasma …
on cubic silicon carbide (3C-SiC). Al2O3 is deposited both by thermal and plasma …
EPR spectroscopic studies of neutron-irradiated nanocrystalline silicon carbide (3C-SiC)
E Huseynov, A Jazbec - Silicon, 2019 - Springer
Nanocrystalline silicon carbide (3C-SiC) has been irradiated by neutrons (2× 10 13 n⋅ cm−
2 s− 1) up to 20 hours. Paramagnetic centers and their nature have been investigated …
2 s− 1) up to 20 hours. Paramagnetic centers and their nature have been investigated …
[HTML][HTML] Protrusions reduction in 3C-SiC thin film on Si
M Zimbone, M Mauceri, G Litrico… - Journal of Crystal …, 2018 - Elsevier
We present a study for large defects called protrusions that form during the hetero-epitaxy of
SiC on Si. We focus first on surface morphology, size, three-dimensional shape and internal …
SiC on Si. We focus first on surface morphology, size, three-dimensional shape and internal …
Sublimation growth of bulk 3C-SiC using 3C-SiC-on-Si (1 0 0) seeding layers
P Schuh, M Schöler, M Wilhelm, M Syväjärvi… - Journal of Crystal …, 2017 - Elsevier
We have developed a transfer process of 3C-SiC-on-Si (1 0 0) seeding layers grown by
chemical vapor deposition onto a poly-or single-crystalline SiC carrier. Applying subsequent …
chemical vapor deposition onto a poly-or single-crystalline SiC carrier. Applying subsequent …
Carbonization and transition layer effects on 3C-SiC film residual stress
In this work an extended study of the carbonization process of the silicon surface and of a
low temperature transition layer in the temperature rump on the 3C-SiC epitaxial growth has …
low temperature transition layer in the temperature rump on the 3C-SiC epitaxial growth has …
Ohmic contacts on n-type and p-type cubic silicon carbide (3C-SiC) grown on silicon
This paper is a report on Ohmic contacts on n-type and p-type type cubic silicon carbide (3C-
SiC) layers grown on silicon substrates. In particular, the morphological, electrical and …
SiC) layers grown on silicon substrates. In particular, the morphological, electrical and …
Electrical passivation of stacking-fault crystalline defects in MOS capacitors on cubic silicon carbide (3C-SiC) by post-deposition annealing
The interfacial electrical properties of deposited oxide (SiO 2) onto cubic silicon carbide (3C-
SiC) were investigated after different post-oxide deposition annealing (PDA) by means of …
SiC) were investigated after different post-oxide deposition annealing (PDA) by means of …