Power Electronic Semiconductor Materials for Automotive and Energy Saving Applications – SiC, GaN, Ga2O3, and Diamond

PJ Wellmann - Zeitschrift für anorganische und allgemeine …, 2017 - Wiley Online Library
Power electronics belongs to the future key technologies in order to increase system
efficiency as well as performance in automotive and energy saving applications. Silicon is …

Status and prospects of cubic silicon carbide power electronics device technology

F Li, F Roccaforte, G Greco, P Fiorenza, F La Via… - Materials, 2021 - mdpi.com
Wide bandgap (WBG) semiconductors are becoming more widely accepted for use in power
electronics due to their superior electrical energy efficiencies and improved power densities …

[HTML][HTML] Extended defects in 3C-SiC: Stacking faults, threading partial dislocations, and inverted domain boundaries

M Zimbone, A Sarikov, C Bongiorno, A Marzegalli… - Acta Materialia, 2021 - Elsevier
The presence of extended bi-dimensional defects is one of the key issues that hinder the
use of wide band-gap materials hetero-epitaxially grown on silicon. In this work, we …

[HTML][HTML] Al2O3 Layers Grown by Atomic Layer Deposition as Gate Insulator in 3C-SiC MOS Devices

E Schilirò, P Fiorenza, R Lo Nigro, B Galizia, G Greco… - Materials, 2023 - mdpi.com
Metal-oxide-semiconductor (MOS) capacitors with Al2O3 as a gate insulator are fabricated
on cubic silicon carbide (3C-SiC). Al2O3 is deposited both by thermal and plasma …

EPR spectroscopic studies of neutron-irradiated nanocrystalline silicon carbide (3C-SiC)

E Huseynov, A Jazbec - Silicon, 2019 - Springer
Nanocrystalline silicon carbide (3C-SiC) has been irradiated by neutrons (2× 10 13 n⋅ cm−
2 s− 1) up to 20 hours. Paramagnetic centers and their nature have been investigated …

[HTML][HTML] Protrusions reduction in 3C-SiC thin film on Si

M Zimbone, M Mauceri, G Litrico… - Journal of Crystal …, 2018 - Elsevier
We present a study for large defects called protrusions that form during the hetero-epitaxy of
SiC on Si. We focus first on surface morphology, size, three-dimensional shape and internal …

Sublimation growth of bulk 3C-SiC using 3C-SiC-on-Si (1 0 0) seeding layers

P Schuh, M Schöler, M Wilhelm, M Syväjärvi… - Journal of Crystal …, 2017 - Elsevier
We have developed a transfer process of 3C-SiC-on-Si (1 0 0) seeding layers grown by
chemical vapor deposition onto a poly-or single-crystalline SiC carrier. Applying subsequent …

Carbonization and transition layer effects on 3C-SiC film residual stress

R Anzalone, G Litrico, N Piluso, R Reitano… - Journal of Crystal …, 2017 - Elsevier
In this work an extended study of the carbonization process of the silicon surface and of a
low temperature transition layer in the temperature rump on the 3C-SiC epitaxial growth has …

Ohmic contacts on n-type and p-type cubic silicon carbide (3C-SiC) grown on silicon

M Spera, G Greco, RL Nigro, C Bongiorno… - Materials Science in …, 2019 - Elsevier
This paper is a report on Ohmic contacts on n-type and p-type type cubic silicon carbide (3C-
SiC) layers grown on silicon substrates. In particular, the morphological, electrical and …

Electrical passivation of stacking-fault crystalline defects in MOS capacitors on cubic silicon carbide (3C-SiC) by post-deposition annealing

P Fiorenza, L Maiolo, G Fortunato, M Zielinski… - Journal of Applied …, 2022 - pubs.aip.org
The interfacial electrical properties of deposited oxide (SiO 2) onto cubic silicon carbide (3C-
SiC) were investigated after different post-oxide deposition annealing (PDA) by means of …