Failure mechanisms driven reliability models for power electronics: A review

OE Gabriel, DR Huitink - Journal of …, 2023‏ - asmedigitalcollection.asme.org
Miniaturization as well as manufacturing processes that electronics devices are subjected to
often results in to increase in operational parameters such as current density, temperature …

Highly accelerated life testing (HALT): A review from a statistical perspective

DH Collins, AV Huzurbazar… - Wiley Interdisciplinary …, 2024‏ - Wiley Online Library
Despite its use in one form or another for at least four decades, HALT and related
techniques [eg, highly accelerated‐stress screening (HASS) and stress audits (HASA)] are …

Electrochemical migration characteristics of eutectic SnPb solder alloy in printed circuit board

SB Lee, YR Yoo, JY Jung, YB Park, YS Kim, YC Joo - Thin solid films, 2006‏ - Elsevier
The smaller size and higher integration of electronic components result in smaller gaps
between metal conducting layers in an electronic package and printed circuit board (PCB) …

Influence of electrochemical properties on electrochemical migration of SnPb and SnBi solders

YR Yoo, YS Kim - Metals and Materials International, 2010‏ - Springer
SnPb solders have been widely used in many fields because of their excellent solderability.
To respond to environmental and health concerns regarding SnPb solders, it is necessary to …

Corrosion in electronics

R Ambat, HVC Gudla, V Verdingovas - Reference Module in Chemistry …, 2017‏ - orbit.dtu.dk
Electronic control units, power modules, and consumer electronics are used today in a wide
variety of varying climatic conditions. Varying external climatic conditions of temperature and …

Surface failure mechanism of PCB-ENIG in typical outdoor atmospheric environments

P Yi, K **ao, K Ding, C Dong, X Li - Materials Research Bulletin, 2017‏ - Elsevier
Electroless nickel/immersion gold (ENIG)-plated printed circuit boards (PCBs) were exposed
to typical atmospheric environments in China for prolonged periods to understand the …

Thermomechanical and electrochemical reliability of fine-pitch through-package-copper vias (TPV) in thin glass interposers and packages

K Demir, K Ramachandran, Y Sato… - 2013 IEEE 63rd …, 2013‏ - ieeexplore.ieee.org
This paper reports reliability of copper-plated through-package-vias (TPVs) in glass
interposer by modeling and experimental validation using accelerated life tests. In this …

Electrochemical migration behavior and mechanism of PCB-ImAg and PCB-HASL under adsorbed thin liquid films

K Ding, X Li, X Kui, C Dong, K Zhang, R Zhao - Transactions of Nonferrous …, 2015‏ - Elsevier
The electrochemical migration (ECM) behavior and mechanism of immersion silver
processing circuit board (PCB-ImAg) and hot air solder leveling circuit board (PCB-HASL) …

Embedded systems and printed circuit boards as weak spots in HV-H3TRB tests

A Brunko, MR Meier, M Gloth, N Kaminski - Microelectronics Reliability, 2022‏ - Elsevier
Abstract Wide-band-gap (WBG) devices and embedding technology offer a huge advantage
when increasing the power density of power electronics. However, the miniaturisation leads …

Related to Soldering

K Dušek, D Bušek, P Veselý - Welding: Modern Topics, 2021‏ - books.google.com
The formation of defects and imperfections in the soldering process can have many causes,
which primarily include a poorly setup technological process, inappropriate or …