Variable-to-Variable Run Length Encoding Technique for Testing Low Power VLSI Circuits
ZF Zaba, I Hussein - IIRJET, 2019 - iirjet.org
Enhancing the integration capability in semiconductor technology requires a large amount of
test data, resulting in higher memory, time for transition and time for testing. A novel lossless …
test data, resulting in higher memory, time for transition and time for testing. A novel lossless …