Do** of III-nitride materials

P Pampili, PJ Parbrook - Materials Science in Semiconductor Processing, 2017 - Elsevier
In this review paper we will report the current state of research regarding the do** of III-
nitride materials and their alloys. GaN is a mature material with both n-type and p-type …

Fundamentals and engineering of defects

P Rudolph - Progress in Crystal Growth and Characterization of …, 2016 - Elsevier
An overview of the important defect types, their origins and interactions during the bulk
crystal growth from the melt and selected epitaxial processes is given. The equilibrium and …

[HTML][HTML] The role of chemical potential in compensation control in Si: AlGaN

S Washiyama, P Reddy, B Sarkar… - Journal of Applied …, 2020 - pubs.aip.org
Reduction in compensation in Si-doped Al-rich AlGaN is demonstrated via chemical
potential control (CPC). The chemical potentials and the resulting formation energies of …

Preparation of degenerate n-type AlxGa1− xN (0< x≤ 0.81) with record low resistivity by pulsed sputtering deposition

Y Nishikawa, K Ueno, A Kobayashi… - Applied Physics Letters, 2023 - pubs.aip.org
Highly conductive AlGaN alloys hold a great technological potential, wherein the
degenerate n-type do** is key in reducing parasitic resistances in electronic and opto …

10.6% external quantum efficiency germicidal UV LEDs grown on thin highly conductive n-AlGaN

M Wang, F Wu, Y Yao, C Zollner, M Iza, M Lam… - Applied Physics …, 2023 - pubs.aip.org
We report on the material challenges of the growth of highly conductive n-AlGaN in
germicidal ultraviolet light emitting diodes (GUV LEDs), with the degradation of the surface …

[HTML][HTML] Impact of Si do** on dislocation behavior in MOVPE-grown AlN on high-temperature annealed AlN buffer layers

A Mogilatenko, S Walde, S Hagedorn… - Journal of Applied …, 2022 - pubs.aip.org
In this work, we compare the defect structure in unintentionally doped and Si-doped AlN
layers grown by metalorganic vapor phase epitaxy (MOVPE) on high-temperature annealed …

Acceleration of the yellow band luminescence in GaN layers via Si and Ge do**

T Vaněk, V Jarý, T Hubáček, F Hájek, K Kuldova… - Journal of Alloys and …, 2022 - Elsevier
A huge acceleration of the yellow band defect luminescence (YB) with increasing Si and Ge
do** concentration in GaN layers has been observed and studied. The donor do** …

Atomistic Understanding of Dislocation Climb in Nitride Semiconductors: Role of Asymmetric Jogs

H Yang, X Han, X Yang, Y Song, B Chen, Z Chen… - Physical Review Letters, 2025 - APS
Effective control of dislocation climb is of fundamental interest and practical importance in
tuning the mechanical and electronic properties of semiconductors. However, it remains a …

Composition dependent valence band order in c-oriented wurtzite AlGaN layers

B Neuschl, J Helbing, M Knab, H Lauer… - Journal of Applied …, 2014 - pubs.aip.org
The valence band order of polar wurtzite aluminum gallium nitride (AlGaN) layers is
analyzed for a dense series of samples, grown heteroepitaxially on sapphire substrates …

Screening of the quantum-confined Stark effect in AlN/GaN nanowire superlattices by germanium do**

P Hille, J Müßener, P Becker, M De La Mata… - Applied Physics …, 2014 - pubs.aip.org
We report on electrostatic screening of polarization-induced internal electric fields in
AlN/GaN nanowire heterostructures with germanium-doped GaN nanodiscs embedded …