This book presents fault-tolerant techniques for programmable architectures, the well-known
Field Programmable Gate Arrays (FPGAs), customizable by SRAM. FPGAs are becoming …

This paper presents a method to protect memories against multiple bit upsets and to improve
manufacturing yield. The proposed method, called a Matrix code, combines Hamming and …

Single event upset (SEU) has become one of the major threats to dependable application
development targeted at safety systems in field programmable gate arrays (FPGAs). This …

With advances in process technology, soft errors (SE) are becoming an increasingly critical
design concern. Due to their large area and high density, caches are worst hit by soft errors …

New areas of ICT applications require complete redesign of computer systems to address
challenges of extreme reliability, high performance and power efficiency. Up to now there …

Modern SoC architectures manufactured at ever-decreasing geometries use multiple
embedded memories. Error detection and correction codes are becoming increasingly …

Memories are one of the most widely used elements in electronic systems, and their
reliability when exposed to single events upsets (SEUs) has been studied extensively. As …

Technological innovations in small satellites especially CubeSats have become attractive
because of their low development cost and numerous applications, such as Earth remote …

Hybrid memories are envisioned as one of the alternatives to existing semiconductor
memories. Although offering enormous data storage capacity, low power consumption, and …

This paper discusses fault-tolerant techniques for SRAM-based FPGAs. These techniques
can be based on circuit level modifications, with obvious modifications in the programmable …