Electron holography provides a unique phase-imaging approach for characterizing
nanoscale electrostatic and magnetic fields. From the relative phase shifts of the electron …

This article is the second article in a three-part series dedicated to reviewing each process
step in crystalline silicon (c-Si) photovoltaic (PV) module manufacturing process: feedstock …

Kelvin probe force microscopy is a scanning probe technique capable of map** the local
surface potential or work function on various surfaces with high spatial resolution. This …

Atomic force microscopy (AFM) is a key tool for nanotechnology research and finds its
principal application in the determination of surface topography. However, the use of the …

A myriad of security vulnerabilites can be exposed via the reverse engineering of the
integrated circuits contained in electronics systems. The goal of IC reverse engineering is to …

Kelvin probe force microscopy (KPFM) is used to investigate the electrostatic force between
a conductive probe and nanostructured Si with shallow or buried selectively doped regions …

Analog Integrated Circuits (ICs) are one of the top targets for counterfeiting. However, the
security of analog Intellectual Property (IP) is not well investigated as its digital counterpart …

In this perspectives paper we will explore the do** state-of-the-art as it evolves for 3D to
2D structures and materials, and the following impact on the metrology methods needed to …

Despite many recent research efforts, the influence of grain boundaries (GBs) on device
properties of CuIn1− xGaxSe2 solar cells is still not fully understood Here, we present a …

The do** characteristics and carrier transport in a GaAs pn junction were visualized with
a∼ 10 nm spatial resolution, using light-modulated scanning tunneling spectroscopy. The …