[HTML][HTML] Frontiers of magnetic force microscopy

O Kazakova, R Puttock, C Barton… - Journal of applied …, 2019 - pubs.aip.org
Since it was first demonstrated in 1987, magnetic force microscopy (MFM) has become a
truly widespread and commonly used characterization technique that has been applied to a …

Force measurements with the atomic force microscope: Technique, interpretation and applications

HJ Butt, B Cappella, M Kappl - Surface science reports, 2005 - Elsevier
The atomic force microscope (AFM) is not only a tool to image the topography of solid
surfaces at high resolution. It can also be used to measure force-versus-distance curves …

Spin map** at the nanoscale and atomic scale

R Wiesendanger - Reviews of Modern Physics, 2009 - APS
The direct observation of spin structures with atomic-scale resolution, a long-time dream in
condensed matter research, recently became a reality based on the development of spin …

Atomic force microscopy

D Rugar, P Hansma - Physics today, 1990 - pubs.aip.org
In 1986 Gerd Binnig and Heinrich Rohrer shared the Nobel Prize in Physics for inventing the
scanning tunneling microscope and discovering that it can image individual surface atoms …

Tap** mode atomic force microscopy in liquids

PK Hansma, JP Cleveland, M Radmacher… - Applied Physics …, 1994 - pubs.aip.org
Tap** mode atomic force microscopy in liquids gives a substantial improvement in
imaging quality and stability over standard contact mode. In tap** mode the probe‐sample …

[КНИГА][B] Scanning probe microscopy: the lab on a tip

E Meyer, HJ Hug, R Bennewitz - 2004 - Springer
Written by three leading experts in the field, this book describes and explains all essential
aspects of scanning probe microscopy. Emphasis is placed on the experimental design and …

Nanoscale magnetic field imaging for 2D materials

E Marchiori, L Ceccarelli, N Rossi, L Lorenzelli… - Nature Reviews …, 2022 - nature.com
Nanoscale magnetic imaging can provide microscopic information about length scales,
inhomogeneity and interactions of materials systems. As such, it is a powerful tool to probe …

Improved fiber‐optic interferometer for atomic force microscopy

D Rugar, HJ Mamin, P Guethner - Applied Physics Letters, 1989 - pubs.aip.org
A high‐sensitivity fiber‐optic displacement sensor for atomic force microscopy is described.
The sensor is based on the optical interference occurring in the micron‐sized cavity formed …

An atomic‐resolution atomic‐force microscope implemented using an optical lever

S Alexander, L Hellemans, O Marti, J Schneir… - Journal of applied …, 1989 - pubs.aip.org
We present the first atomic-resolution image of a surface obtained with an optical
implementation of the atomic-force microscope (AFM), The native oxide on silicon was …