The Understanding and Compact Modeling of Reliability in Modern Metal–Oxide–Semiconductor Field-Effect Transistors: From Single-Mode to Mixed-Mode …
With the technological scaling of metal–oxide–semiconductor field-effect transistors
(MOSFETs) and the scarcity of circuit design margins, the characteristics of device reliability …
(MOSFETs) and the scarcity of circuit design margins, the characteristics of device reliability …
Design for manufacturability and reliability in extreme-scaling VLSI
In the last five decades, the number of transistors on a chip has increased exponentially in
accordance with the Moore's law, and the semiconductor industry has followed this law as …
accordance with the Moore's law, and the semiconductor industry has followed this law as …
A novel majority based imprecise 4: 2 compressor with respect to the current and future VLSI industry
MR Taheri, A Arasteh, S Mohammadyan… - Microprocessors and …, 2020 - Elsevier
Imprecising the arithmetic hardware blocks is well known as one of the brilliant approaches
that increase the performance of digital signal processors (DSP) at the cost of imposing …
that increase the performance of digital signal processors (DSP) at the cost of imposing …
Towards reliability-aware circuit design in nanoscale FinFET technology:—New-generation aging model and circuit reliability simulator
In this paper, an industry-level new-generation EDA solution for reliability-aware design in
nanoscale FinFET technology is presented for the first time, with new compact transistor …
nanoscale FinFET technology is presented for the first time, with new compact transistor …
CAD for Analog/Mixed‐Signal Integrated Circuits
While digital integrated circuits (ICs) has adopted highly automated computer aided design
(CAD) tools for decades including synthesis, placement, and routing, analog, and mixed …
(CAD) tools for decades including synthesis, placement, and routing, analog, and mixed …
Reliable and high performance asymmetric FinFET SRAM cell using back-gate control
As the technology scales down, the performance characteristics are degraded and the
reliability of digital circuits against soft error and aging effects are reduced. In this paper, we …
reliability of digital circuits against soft error and aging effects are reduced. In this paper, we …
Uniform non-Bernoulli sequences oriented locating method for reliability-critical gates
Hardening reliability-critical gates in a circuit is an important step to improve the circuit
reliability at a low cost. However, accurately locating the reliability-critical gates is a key …
reliability at a low cost. However, accurately locating the reliability-critical gates is a key …
Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization
Transistor aging leads to the deterioration of analog circuit performance over time. The worst
aging degradation is used to evaluate the circuit reliability. It is extremely expensive to …
aging degradation is used to evaluate the circuit reliability. It is extremely expensive to …
Aging-Aware Critical Path Selection via Graph Attention Networks
In advanced technology nodes, aging effects like negative and positive bias temperature
instability (NBTI and PBTI) become increasingly significant, making timing closure and …
instability (NBTI and PBTI) become increasingly significant, making timing closure and …
Work hard, sleep well-avoid irreversible ic wearout with proactive rejuvenation
Various wearout mechanisms have both a reversible and an irreversible (permanent) part,
with some, like BTI and EM having a significant reversible part, while others, like HCI, being …
with some, like BTI and EM having a significant reversible part, while others, like HCI, being …