Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the
surface potential on a broad range of materials. KPFM measurements require an …

The current status and future prospects of non‐contact atomic force microscopy (nc‐AFM)
and Kelvin probe force microscopy (KPFM) for studying insulating surfaces and thin …

The Handbook of Surface and Nanometrology explains and challenges current concepts in
nanotechnology. It covers in great detail surface metrology and nanometrology and more …

Abstract 2D hexagonal boron nitride (hBN) is a wide‐bandgap van der Waals crystal with a
unique combination of properties, including exceptional strength, large oxidation resistance …

We compare the three most commonly used scanning probe techniques to obtain a reliable
value of the work function in graphene domains of different thickness. The surface potential …

Chalcopyrite solar cells achieve efficiencies above 23%. The latest improvements are due to
post‐deposition treatments (PDT) with heavy alkalis. This study provides a comprehensive …

Seven years have passed since the first volume “Kelvin probe force microscopy—Measuring
and compensating electrostatic forces” has been published in 2011. It presented the first …

Kelvin probe force microscopy (KPFM) could identify the local work function of surface at
nanoscale with high-resolution on the basis of simultaneous visualization of surface …

Abstract 2D metal halide perovskites are attracting great interest for their diverse
applications owing to their intrinsic superior stability compared to their 3D counterparts; …

We conducted a comprehensive Kelvin probe force microscopy (KPFM) study on a classical
organic solar cell system consisting of MDMO− PPV/PCBM blends. The KPFM method yields …