This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting
with its invention and covering most of the recent developments. Today, dynamic force …

In this report we review the fundamentals, applications and future tendencies of dynamic
atomic force microscopy (AFM) methods. Our focus is on understanding why the changes …

The past two decades have seen atomic force microscopy (AFM) evolve from an
experimental technique to probe simple surface topography to one that can spatially map …

Since it was invented by Binnig et al in 1986, atomic force microscopy (AFM) has played a
crucial role in nano-scale science and technology. AFM is a microscopic technique imaging …

Piezoelectric resonators have been in use as mass-sensing devices for almost half a
century. More recently it was recognized that shifts in frequency and bandwidth can come …

This article describes new perspectives on SPM-related science and technology, based on
systems and control theory. These perspectives have led to a better understanding of SPM …

Frequency-modulation atomic force microscopy (FMAFM) has proven to be a powerful
method for imaging surfaces with true atomic resolution. However, the tip–sample forces are …

The conservative and dissipative forces between tip and sample of a dynamic atomic force
microscopy (AFM) were investigated using a combination of computer simulations and …

True atomic resolution of conductors and insulators is now routinely obtained in vacuum by
frequency modulation atomic force microscopy. So far, the imaging parameters (ie …

Frequency modulation atomic force microscopy is a method for imaging the surface of
metals, semiconductors and insulators in ultrahigh vacuum with true atomic resolution. The …