[BOOK][B] VLSI test principles and architectures: design for testability

LT Wang, CW Wu, X Wen - 2006 - books.google.com
This book is a comprehensive guide to new DFT methods that will show the readers how to
design a testable and quality product, drive down test cost, improve product quality and …

An amalgamated testability measure derived from machine intelligence

S Roy, VD Agrawal - … Conference on VLSI Design and 2024 …, 2024 - ieeexplore.ieee.org
A testability measure provides test-related information about signal nodes of a circuit.
Operations like test generation and test point insertion are exponentially complex in terms of …

Nimrod/K: towards massively parallel dynamic grid workflows

D Abramson, C Enticott, I Altinas - SC'08: Proceedings of the …, 2008 - ieeexplore.ieee.org
A challenge for Grid computing is the difficulty in develo** software that is parallel,
distributed and highly dynamic. Whilst there have been many general purpose mechanisms …

Method for testability analysis and test point insertion at the RT-level of a hardware development language (HDL) specification

S Boubezari, E Cerny, B Kaminska… - US Patent …, 2002 - Google Patents
A method is provided for producing a synthesizable RT-Level specification, having a
testability enhancement from a starting RT-Level specification representative of a circuit to …

Towards understanding how developers spend their effort during maintenance activities

Z Soh, F Khomh, YG Guéhéneuc… - 2013 20th working …, 2013 - ieeexplore.ieee.org
For many years, researchers and practitioners have strived to assess and improve the
productivity of software development teams. One key step toward achieving this goal is the …

[PDF][PDF] Behavioral synthesis of highly testable data paths under the non-scan and partial scan environments

TC Lee, NK Jha, WH Wolf - Proceedings of the 30th international Design …, 1993 - dl.acm.org
Behauzorai synthesis tools which only optimize area and performance can easily produce a
hard-to-test archit ecture. In this paper, we propose a new behavioral synthesis algorithm for …

Behavioral synthesis for easy testability in data path scheduling

Lee, Jha - 1992 IEEE/ACM International Conference on …, 1992 - ieeexplore.ieee.org
A data path scheduling algorithm to improve testability without assuming any particular test
strategy is presented. A scheduling heuristic for easy testability, based on previous work on …

Incorporating testability considerations in high-level synthesis

A Mujumdar, R Jain, K Saluja - Journal of Electronic Testing, 1994 - Springer
In this article we propose two novel methods to improve the testability of the designs
produced by high-level synthesis tools. Our first method, loop-breaking algorithm, identifies …

High-level synthesis for testability: A survey and perspective

KD Wagner, S Dey - Proceedings of the 33rd annual Design Automation …, 1996 - dl.acm.org
High-Level Synthesis for Testability: A Survey and Perspective Page 1 High-Level Synthesis for
Testability: A Survey and Perspective Kenneth D. Wagner Synopsys, Inc. 700 East Middlefield …

An improved method for RTL synthesis with testability tradeoffs

H Harmanani, CA Papachristou - Proceedings of 1993 …, 1993 - ieeexplore.ieee.org
A method for high level synthesis with testability is presented with the objective to generate
self-testable RTL datapath structures. We base our approach on a new improved testability …