The integration density of electronic systems is limited by the reliability of the integrated
circuits. To guarantee the overall performance, the integrated circuit reliability must be …

Bias Temperature Instability (BTI) and Hot Carrier Injections (HCI) are two of the main effects
that increase a transistor's threshold voltage and further cause performance degradations …

Abstract Systems on Chips are increasingly involved in critical equipment in the fields of
aeronautics, transportations, and energy. Therefore, monitoring their life cycle is a crucial …

This paper presents techniques for gate-oxide and middle-of-line (MOL) time-dependent
dielectric breakdown (TDDB) lifetime assessment of microprocessors and digital circuits …

A framework is proposed to perform timing analysis of state-of-art microprocessors
considering the impact of process-voltage-temperature (PVT) variations and the aging effect …

Back-end wearout mechanisms are major reliability concerns for modern microprocessors.
In this paper, a framework that contains modules for back-end time-dependent dielectric …

A framework is proposed to analyze system-level reliability and evaluate the lifetimes of
state-of-art microprocessors considering the impact of process–voltage–temperature (PVT) …

Negative bias temperature instability (NBTI), positive bias temperature instability (PBTI), and
hot carrier injection (HCI) are leading reliability concerns for modern microprocessors. In this …

A framework is proposed to analyze the impact of both Front End of the Line (FEOL) and
Back End of the Line (BEOL) wearout mechanisms on memories embedded within state-of …

Aspects of the disclosed technology include a method including extracting, by a processor, a
plurality of features from one from among a layout of a circuit, a netlist of the circuit, and the …