Layout-aware selection of trace signals for post-silicon debug

P Thakyal, P Mishra - 2014 IEEE Computer Society Annual …, 2014 - ieeexplore.ieee.org
Post-silicon debug is widely acknowledged as a bottleneck in SoC design methodology. A
major challenge during post-silicon debug is the limited observability of internal signals …

A Flexible Programmable Memory BIST Architecture

P Daniel, R Chandel - IETE Journal of Education, 2010 - Taylor & Francis
In the present paper a moderate area programmable memory built-in-self-test (BIST)
architecture supporting multiple algorithm loading is proposed. The entire BIST operation is …

Layout-aware signal selection in reconfigurable architectures

P Thakyal, P Mishra - … Symposium on VLSI Design and Test, 2014 - ieeexplore.ieee.org
Post-silicon validation is an important and increasingly complex task in SoC design
methodology. One of the major challenges in post-silicon debug is the limited observability …

Physical-Aware memory BIST datapath synthesis: Architecture and case-studies on complex SoCs

VR Devanathan, S Bhavsar… - 2011 Asian Test …, 2011 - ieeexplore.ieee.org
With increasing scaling, it is common to find large SoCs with more than 40M bits of
embedded SRAMs constituting more than 75% of total die area [1]. Physical design for such …

Reducing test power for embedded memories

A Awad, A Abu-Issa, S Hamdioui - 2011 IEEE International …, 2011 - ieeexplore.ieee.org
With the increased number of embedded memories in mobile devices, minimizing the test
power becomes a serious concern, especially when parallel testing is applied. Battery will …

Computer security: the good, the bad and the ugly

C Meadows - Proceedings. IEEE High-Assurance Systems …, 1996 - ieeexplore.ieee.org
We discuss and characterize different types of solutions to computer security problems in
terms of bad (theoretically sound, but expensive and impractical), ugly (practical, but messy …

[PDF][PDF] LAYOUT-AWARE SIGNAL SELECTION FOR POST-SILICON DEBUG

P THAKYAL - 2014 - cise.ufl.edu
LAYOUT-AWARE SIGNAL SELECTION FOR POST-SILICON DEBUG By PRATEEK THAKYAL
A THESIS PRESENTED TO THE GRADUATE SCHOOL OF THE UNIVERS Page 1 …

[인용][C] Software-based self-test techniques for online test and diagnosis of embedded controllers and memories

PP Daniel - Doctor of Philosophy Thesis, National Institute of …, 2014