A genetic algorithm-based heuristic method for test set generation in reversible circuits

AN Nagamani, SN Anuktha, N Nanditha… - … on Computer-Aided …, 2017 - ieeexplore.ieee.org
Low power circuit design has been one of the major growing concerns in integrated circuit
technology. Reversible circuit (RC) design is a promising future domain in computing which …

Integrated simulation and formal verification of a simple autonomous vehicle

A Domenici, A Fagiolini, M Palmieri - … , Trento, Italy, September 4-5, 2017 …, 2018 - Springer
This paper presents a proof-of-concept application of an approach to system development
based on the integration of formal verification and co-simulation. A simple autonomous …

An interval-valued approach to business process simulation based on genetic algorithms and the BPMN

MGCA Cimino, G Vaglini - Information, 2014 - mdpi.com
Simulating organizational processes characterized by interacting human activities,
resources, business rules and constraints, is a challenging task, because of the inherent …

ASSESS: A simulator of soft errors in the configuration memory of SRAM-based FPGAs

C Bernardeschi, L Cassano… - … on Computer-Aided …, 2014 - ieeexplore.ieee.org
In this paper a simulator of soft errors (SEUs) in the configuration memory of SRAM-based
FPGAs is presented. The simulator, named ASSESS, adopts fault models for SEUs affecting …

ATPG method with a hybrid compaction technique for combinational digital systems

AR Khatri, A Hayek, J Börcsök - 2016 SAI computing …, 2016 - ieeexplore.ieee.org
In this paper, the Test Pattern Generation (TPG) with a new simple hybrid (dynamic and
static) compaction technique for combinational logic circuits and systems is presented …

RETRACTED ARTICLE: Augmented Recurrence Hop** Based Run-Length Coding for Test Data Compression Applications

K Radhika, D Mohana Geetha - Wireless Personal Communications, 2018 - Springer
The advancement in technologies has been increasing with increase in integrating scales
which allows fabricating millions of transistors on a chip. This demands the efficient testing …

UA2TPG: An untestability analyzer and test pattern generator for SEUs in the configuration memory of SRAM-based FPGAS

C Bernardeschi, L Cassano, A Domenici, L Sterpone - Integration, 2016 - Elsevier
This paper presents UA 2 TPG, a static analysis tool for the untestability proof and automatic
test pattern generation for SEUs in the configuration memory of SRAM-based FPGA …

Hardware implementation of genetic algorithm for epileptic seizure detection and prediction

PS Thorbole, SD Kalbhor, VK Harpale… - 2017 International …, 2017 - ieeexplore.ieee.org
Millions of people living with epilepsy in the world and most of them are from develo**
countries. Epilepsy occurs due to epileptic seizures and mainly observed in children and …

Evaluation of the SEU Faults Coverage of a Simple Fault Model for Application-Oriented FPGA Testing

J Borecký, R Hülle, P Fišer - 2020 23rd Euromicro Conference …, 2020 - ieeexplore.ieee.org
Testing of FPGA-based designs persists to be a challenging task because of the complex
FPGA architecture with heterogeneous components, and therefore a complicated fault …

Analysis and test of the effects of single event upsets affecting the configuration memory of SRAM-based FPGAs

L Cassano - 2014 International Test Conference, 2014 - ieeexplore.ieee.org
In the Ph. D. thesis1 from which this summary has been extracted the author proposed a
framework of methodologies for the analysis and test of the effects of Single Event Upsets …