Architectures of bulk built-in current sensors for detection of transient faults in integrated circuits

RP Bastos, LA Guimaraes, FS Torres, L Fesquet - Microelectronics Journal, 2018 - Elsevier
Today's integrated circuits are liable to operate under transient faults created either by
radiation or malicious sources of perturbation. Among the many techniques for the detection …

A bulk built-in sensor for detection of fault attacks

RP Bastos, FS Torres, JM Dutertre… - … Security and Trust …, 2013 - ieeexplore.ieee.org
This work presents a novel scheme of built-in current sensor (BICS) for detecting transient
fault-based attacks of short and long duration as well as from different simultaneous sources …

Assessment of on-chip current sensor for detection of thermal-neutron-induced transients

RP Bastos, JM Dutertre, MG Trindade… - … on Nuclear Science, 2020 - ieeexplore.ieee.org
This article assesses, for the first time, a body/bulk built-in current sensor (BBICS) in a CMOS
65-nm test chip under thermal neutron, high-energy neutron, and laser radiation …

Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection

JM Dutertre, RP Bastos, O Potin, ML Flottes… - Microelectronics …, 2013 - Elsevier
Abstract Bulk Built-In Current Sensors (BBICSs) are able to detect anomalous transient
currents induced in the bulk of integrated circuits when hit by ionizing particles. This paper …

Comparison of bulk built-in current sensors in terms of transient-fault detection sensitivity

RP Bastos, JM Dutertre… - 2014 5th European …, 2014 - ieeexplore.ieee.org
Several architectures of Bulk Built-In Current Sensors (BBICS) were recently proposed to
monitor transient faults induced on integrated circuits by radiation or malicious sources. This …

Hacking and protecting IC hardware

S Hamdioui, JL Danger, G Di Natale… - … , Automation & Test …, 2014 - ieeexplore.ieee.org
Traditionally most of people treat a hardware solution as an inherently trusted box.“it is
hardware not software; so it is secure and trustworthy”, they say. Recent research shows the …

Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors

R de Oliveira Rocha, FS Torres, RP Bastos - Microelectronics Reliability, 2017 - Elsevier
Soft error resilience is an increasingly important requirement of integrated circuits realized in
CMOS nanometer technologies. Among the several approaches, Bulk Built-in Current …

A single built-in sensor to check pull-up and pull-down CMOS networks against transient faults

RP Bastos, FS Torres, JM Dutertre… - … Workshop on Power …, 2013 - ieeexplore.ieee.org
This work proposes a novel built-in current sensor for detecting transient faults of short and
long duration as well as multiple faults in combinational and sequential logic. Unlike prior …

[BOOK][B] On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits

RP Bastos, FS Torres - 2020 - Springer
Many types of new-generation electronics systems surround nowadays our lives, providing
solutions, utilities, and conveniences we had never experimented before. Biomedical …

Low cost rollback to improve fault-tolerance in VLSI circuits

T Bonnoit, NE Zergainoh, M Nicolaidis… - 2017 IEEE 8th Latin …, 2017 - ieeexplore.ieee.org
In nanometer technologies, circuits are more and more sensitive to various kinds of
perturbations. Alpha particles and atmospheric neutrons are affecting storage elements as …