This paper reviews several full adder (FA) designs in single-electron technology (SET). In
addition to the structure and size (ie, number of devices), this paper tries to provide a …

Today's computing is increasingly data-intensive, heralding the age of big data. With greater
data volumes, come the needs for faster processing, greater storage capacity, and …

Limiting or reducing the power consumption of the digital circuits for calculation is now the
main concern in nanoelectronic domain. For this purpose, spintronic devices are proposed …

This work presents a novel architecture, which is both device and circuit independent. The
starting idea is that computations can be performed in three fundamentally different ways …

This chapter will start with a brief review of nanoelectronic challenges while focusing on the
reliability challenge. One of the most recent call-to-arms [1] raises two fundamental …

This paper will briefly review nanoelectronic challenges while focusing on reliability. We
shall present and analyze a series of CMOS-based examples for addition starting from the …

In this paper we analyse a serial (ripple carry) and a parallel (Kogge-Stone) adder when
operating in subthreshold at 100nm and 70nm. These are targeted for ultra low power …

This paper describes two MATLAB modules which have been developed for enhancing
SIMON, a Monte Carlo simulator for single electron technology (SET) circuits. The first …

The importance of reliability in large distributed systems can not be underestimated.
Considerable effort has been directed towards the development of software reuse. However …

Threshold-logic gates have long been known to result in more compact and faster circuits
when compared to conventional AND/OR logic equivalents [1], However, threshold logic …