Measuring Apparatus, On-Chip Instrumentation Device and Measuring Method
K Yoshioka, M Hashisaka, K Muraki… - US Patent App. 17 …, 2023 - Google Patents
2022-08-18 Assigned to NIPPON TELEGRAPH AND TELEPHONE CORPORATION
reassignment NIPPON TELEGRAPH AND TELEPHONE CORPORATION ASSIGNMENT OF …
reassignment NIPPON TELEGRAPH AND TELEPHONE CORPORATION ASSIGNMENT OF …
Super resolution time domain spectroscopy method and device for sample characterization
R Peretti - US Patent 12,044,620, 2024 - Google Patents
A method for determining a set of physical parameters of a sample, comprising the steps of:—
A Retrieving a measured sample temporal trace Es (t),—B retrieving a measured reference …
A Retrieving a measured sample temporal trace Es (t),—B retrieving a measured reference …