This paper presents a compression/decompression scheme based on selective Huffman
coding for reducing the amount of test data that must be stored on a tester and transferred to …

We present a test resource partitioning (TRP) technique that simultaneously reduces test
data volume, test application time, and scan power. The proposed approach is based on the …

This paper presents a new test-data compression technique that uses exactly nine
codewords. Our technique aims at precomputed data of intellectual property cores in system …

This article mixes two encoding techniques to reduce test data volume, test pattern delivery
time, and power dissipation in scan test applications. This is achieved by using run-length …

This paper presents a perspective on the impact and use of new media that focuses on the
strength of the interpersonal tie connecting communicators. Research shows that more …

We present a dictionary-based test data compression approach for reducing test data
volume and testing time in SOCs. The proposed method is based on the use of a small …

We present a dictionary-based test data compression approach for reducing test data
volume in SOCs. The proposed method is based on the use of a small number of ATE …

The run length based coding schemes have been very effective for the test data
compression in case of current generation SoCs with a large number of IP cores. The first …

Increased levels of chip integration combined with physical limitations of heat removal
devices, cooling mechanisms and battery capacity, have established energy-efficiency as an …

One of the major challenges in testing a system-on-a-chip is dealing with the large volume of
test data. To reduce the volume of test data, several test data compression techniques have …