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[HTML][HTML] Normalized signature graph of analog circuits for fault classification using digital testing
This paper presents the power-on signature graph of analog circuits for fault classification.
This graph can be attained using the simulation mechanism through the practical circuit …
This graph can be attained using the simulation mechanism through the practical circuit …
[HTML][HTML] New digital testing for parametric fault detection in analog circuits using classified frequency-bands and efficient test-point selection
This paper presents a new parametric fault detection (PFD) approach for testing of linear
analog circuits. It combines classified frequency-bands with amplitude weighting for fault …
analog circuits. It combines classified frequency-bands with amplitude weighting for fault …
TSV fault contactless testing method based on group delay
Y Shang, Y Zhao, C Li, M Tan… - International Journal of …, 2021 - Taylor & Francis
As through silicon via (TSV) in three-dimensional (3-D) stacked integrated circuit (IC) has
become micro-nanosized, the conventional wafer probe technology cannot fulfil the current …
become micro-nanosized, the conventional wafer probe technology cannot fulfil the current …
Test pattern generator optimization for digital testing of analogue circuits
In this paper, the proposed design for digital testing of analogue circuits (DTAC) is
presented. The proper selection of the analogue test pattern generator (ATPG) for …
presented. The proper selection of the analogue test pattern generator (ATPG) for …
TSV manufacturing fault modeling and diagnosis based on multi-tone dither
Y Shang, M Tan, C Li, L Sun - Journal of Advanced Computational …, 2019 - jstage.jst.go.jp
The faults in through-silicon via (TSV) have a critical impact on the reliability and yield of a
threedimensional integrated circuit (3-D IC). With the significant increase in the number of …
threedimensional integrated circuit (3-D IC). With the significant increase in the number of …
Parametric Fault Detection of Analogue Circuits Based on Optimized Support Vector Machine Classifier
Parametric faults in analogue circuits cause system performance degeneration and are hard
to be detected. There are no clear boundaries between fault-free and faulty circuit output …
to be detected. There are no clear boundaries between fault-free and faulty circuit output …