Oscillation-based testing (OBT) and Oscillation-based built-in self-testing (OBIST) circuits
enable detection of catastrophic faults in analogue and RF circuits, but both are sensitive to …

Detection of parametric faults is a crucial issue due to the large variation of the fabrication
process, which provide a range of acceptable parameter deviations in analog circuits. This …

This paper describes a design for testability technique for second-order bandpass
operational transconductance amplifier and capacitor (OTA-C) filters using an oscillation …

A study of oscillation‐based test for high‐order Operational Transconductance Amplifier‐C
(OTA‐C) filters is presented. The method is based on partition of a high‐order filter into …

In this article, an alternative approach to SRAM testing–the dynamic supply current test is
presented, which is used to cover resistive opens considered as “hard detectable” type of …

This paper is mainly focused on the investigation of the optimum value of the oscillation
frequency in the Oscillation-based Built-In Self Tests (OBIST). It has been assumed that the …

In this article, a fully on-chip implementation of the oscillation-based test for analog and
mixed-signal systems is presented. The proposed test hardware uses an on-chip reference …

In this paper, oscillation-based built-in self-test method is used to diagnose catastrophic and
parametric faults in integrated circuits. Sallen–Key low pass filter and high pass filter circuits …

A new Oscillation Built-In-Self-Test (OBIST) methodology is developed to reduce test time
and complexity in the testing of analog circuit. The technique is incorporated to test an op …

Oscillation-based test algorithm has been proposed and verified experimentally as an
alternative to the specification--based test of analog circuits. Active filters are transformed to …