Study and analysis of advanced 3D multi-gate junctionless transistors

R Kumar, S Bala, A Kumar - Silicon, 2022 - Springer
As the IC technology is evolving very rapidly, the feature size of the device has been
migrating to sub-nanometre regime for achieving the high packing density. To continue with …

RF and linearity parameter analysis of junction-less gate all around (JLGAA) MOSFETs and their dependence on gate work function

P Raut, U Nanda - Silicon, 2022 - Springer
In this work, a detailed investigation of RF and linearity analysis of junction-less Gate All
Around (JLGAA) MOSFETs through SILVACO TCAD device simulator have been …

[PDF][PDF] Advanced MOSFET Technologies for Next Generation Communication Systems-Perspective and Challenges: A Review.

H Sood, VM Srivastava, G Singh - Journal of Engineering Science & …, 2018 - academia.edu
In this review, authors have retrospect the state-of-art dimension scaling and emerging other
non-conventional MOSFET structures particularly, the Double-Gate (DG) MOSFET and …

Device and circuit-level performance comparison of GAA nanosheet FET with varied geometrical parameters

NA Kumari, P Prithvi - Microelectronics Journal, 2022 - Elsevier
In this paper, DC and analog/RF figures of merit (FOMs) for different geometrical variations
of the Gate all around (GAA) Nanosheet FET (NSFET) are computationally examined. For …

A comprehensive analysis and performance comparison of CombFET and NSFET for CMOS circuit applications

NA Kumari, P Prithvi - AEU-International Journal of Electronics and …, 2023 - Elsevier
The performance of comb-like channel field effect transistor (CombFET) and nanosheet FET
(NSFET) is addressed at both device and circuit levels at the 3-nm node. The CombFET is …

Analytical modeling of gate-all-around junctionless transistor based biosensors for detection of neutral biomolecule species

Y Pratap, M Kumar, S Kabra, S Haldar… - Journal of …, 2018 - Springer
In recent times, FET-based sensors have been widely used in industrial and domestic
applications due to their low cost and high sensitivity. In this paper, a nanogap-embedded …

Effect of interface trap charges on performance variation of heterogeneous gate dielectric junctionless-TFET

S Gupta, K Nigam, S Pandey, D Sharma… - … on Electron Devices, 2017 - ieeexplore.ieee.org
In this paper, we investigate the effect of interface trap charges on the variation of
heterogeneous gate dielectric junctionless-tunnel FET (JL-TFET) by introducing both donor …

Nanosheet field effect transistor device and circuit aspects for future technology nodes

AS Kumar, VB Sreenivasulu, SR Chavva… - ECS Journal of Solid …, 2023 - iopscience.iop.org
Moore's law states that the technical innovations are being absorbed already. The device's
controllability has dramatically improved since moving from a straightforward MOSFET …

Impact of gate material engineering (GME) on analog/RF performance of nanowire Schottky-barrier gate all around (GAA) MOSFET for low power wireless …

M Kumar, S Haldar, M Gupta, RS Gupta - Microelectronics journal, 2014 - Elsevier
Abstract In this paper Gate Material Engineered (GME) Gate-Stack (GS) silicon nanowire
Schottky-Barrier (SB) Gate All Around (GAA) MOSFET and Single Material Gate Stack …

Impact of interface trap charges on performance of electrically doped tunnel FET with heterogeneous gate dielectric

P Venkatesh, K Nigam, S Pandey… - … on Device and …, 2017 - ieeexplore.ieee.org
In this paper, we investigate for the first time effect of positive (donor) and negative
(acceptor) interface trap charges on the performance of proposed heterogeneous gate …