RF MOSFET: recent advances, current status and future trends

JJ Liou, F Schwierz - Solid-State Electronics, 2003 - Elsevier
Recent advances in complementary metal oxide semiconductor (CMOS) processing,
continuous scaling of gate length, and progress in silicon on insulator have stirred serious …

High-performance BiCMOS technologies without epitaxially-buried subcollectors and deep trenches

B Heinemann, R Barth, D Knoll, H Rücker… - Semiconductor …, 2006 - iopscience.iop.org
Abstract A 0.25 µm SiGe: C BiCMOS technology family (SG25H) with high-speed npn and
pnp transistors for different performance requirements is presented. A CMOS-friendly …

Status and direction of communication technologies-SiGe BiCMOS and RFCMOS

AJ Joseph, DL Harame, B Jagannathan… - Proceedings of the …, 2005 - ieeexplore.ieee.org
We present the status and direction of silicon semiconductor technologies targeted for
applications such as wireless, networking, instrumentation, and storage markets. Various …

Scalable time-correlated photon counting system with multiple independent input channels

M Wahl, HJ Rahn, T Röhlicke, G Kell… - Review of Scientific …, 2008 - pubs.aip.org
Time-correlated single photon counting continues to gain importance in a wide range of
applications. Most prominently, it is used for time-resolved fluorescence measurements with …

Displacement damage effects mitigation approach for heterojunction bipolar transistor frequency synthesizers

DI Sotskov, VV Elesin, AG Kuznetsov… - … on Nuclear Science, 2020 - ieeexplore.ieee.org
This work focuses on the design issues of radio frequency (RF) bipolar integrated circuits
(ICs) as a part of frequency synthesizers for extreme environmental applications. It is shown …

Characterization of the static thermal coupling between emitter fingers of bipolar transistors

S Lehmann, Y Zimmermann, A Pawlak… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
A strategy for compact modeling the static thermal coupling between the emitter fingers of
SiGe heterojunction bipolar transistors (SiGe-HBTs) is described. An extraction methodology …

A simple and accurate method for extracting the emitter and thermal resistance of BJTs and HBTs

A Pawlak, S Lehmann… - 2014 IEEE Bipolar/BiCMOS …, 2014 - ieeexplore.ieee.org
A simple yet accurate extraction method for the emitter and thermal resistance of bipolar
transistors is presented. Only DC measurements taken on a thermally controlled wafer …

JICG MOS transistors for reduction of radiation effects in CMOS electronics

R Sorge, J Schmidt, C Wipf, F Reimer… - 2018 IEEE Topical …, 2018 - ieeexplore.ieee.org
In order to improve the total ionizing dose (TID) and single event upset (SEU) radiation
tolerance of bulk CMOS technologies we applied two constructive measures. TID induced …

Bipolar complementary semiconductor device

B Heinenman, J Drews, S Marschmayer… - US Patent …, 2010 - Google Patents
(57) ABSTRACT A complementary BiCMOS semiconductor device comprises a substrate of
a first conductivity type and a number of active regions which are provided therein and which …

Advanced transistor architectures for half-terahertz SiGe HBTs

B Heinemann, A Fox, H Rücker - ECS Transactions, 2013 - iopscience.iop.org
Different technological implementations of high-speed of SiGe HBTs are compared which all
represent a performance level of fmax close to 500 GHz. In addition to technologies with non …