SiGe nanostructures

I Berbezier, A Ronda - Surface Science Reports, 2009 - Elsevier
Since the first studies in the late 1970s most of the researches on Si1− xGex nanostructures
have been motivated by their potential applications in micro, opto and nanoelectronic …

Nanoscale map** of the 3D strain tensor in a germanium quantum well hosting a functional spin qubit device

C Corley-Wiciak, C Richter, MH Zoellner… - … Applied Materials & …, 2023 - ACS Publications
A strained Ge quantum well, grown on a SiGe/Si virtual substrate and hosting two
electrostatically defined hole spin qubits, is nondestructively investigated by synchrotron …

Electrical properties of poly-Ge on glass substrate grown by two-step solid-phase crystallization

K Toko, I Nakao, T Sadoh, T Noguchi, M Miyao - Solid-State Electronics, 2009 - Elsevier
The carrier concentration and mobility of intrinsic holes in poly-Ge films grown by solid-
phase crystallization (SPC) were investigated. The two-step SPC method, consisting of low …

Engineering aspects and applications of the new Raman instrumentation

GD Pitt, DN Batchelder, R Bennett, RW Bormett… - IEE Proceedings-Science …, 2005 - IET
Raman instrumentation design has improved radically in efficiency and ease of use over the
past 15 years. New technologies made this possible with introduction of the first commercial …

Local laser-induced solid-phase recrystallization of phosphorus-implanted Si/SiGe heterostructures for contacts below 4.2 K

M Neul, IV Sprave, LK Diebel, LG Zinkl, F Fuchs… - Physical Review …, 2024 - APS
Si/SiGe heterostructures are of high interest for high-mobility transistor and qubit
applications, specifically for operations below 4.2 K. In order to optimize parameters such as …

Raman investigation of strain in Si∕ SiGe heterostructures: Precise determination of the strain-shift coefficient of Si bands

S Nakashima, T Mitani, M Ninomiya… - Journal of applied …, 2006 - pubs.aip.org
Raman scattering experiments were carried out on Si∕ Si Ge heterostructures. The strain in
both the top Si layer, and the Si 1− x Ge x buffer layers with various Ge compositions was …

Thickness dependence of the strain, band gap and transport properties of epitaxialIn2O3 thin films grownon Y-stabilised ZrO2 (111)

KHL Zhang, VK Lazarov, TD Veal… - Journal of Physics …, 2011 - iopscience.iop.org
Epitaxial films of In 2 O 3 have been grown on Y-stabilised ZrO 2 (111) substrates by
molecular beam epitaxy over a range of thicknesses between 35 and 420 nm. The thinnest …

Decoupling the effects of composition and strain on the vibrational modes of GeSn semiconductors

É Bouthillier, S Assali, J Nicolas… - Semiconductor Science …, 2020 - iopscience.iop.org
We report on the behavior of Ge-Ge, Ge-Sn, Sn-Sn like, and disorder-activated (DA)
vibrational modes in GeSn semiconductors investigated using Raman scattering …

Phonon strain shift coefficients in Si1− xGex alloys

F Pezzoli, E Bonera, E Grilli, M Guzzi… - Journal of Applied …, 2008 - pubs.aip.org
A comprehensive study of the biaxial strain-induced shift of the Si 1− x Ge x Raman active
phonon modes is presented. High-resolution Raman measurements of Si 1− x Ge x/Si …

[KNJIGA][B] Monolithic Nanoscale Photonics-Electronics Integration in Silicon and Other Group IV Elements

H Radamson, L Thylén - 2014 - books.google.com
Silicon technology is evolving rapidly, particularly in board-to-board or chip-to chip
applications. Increasingly, the electronic parts of silicon technology will carry out the data …