Electron diffraction and microscopy are among the most important techniques for studying
the structures of solids. This review aims to give a comprehensive introduction to the basic …

Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction,
and spectroscopy of materials down to atomic resolution. Recent advances in detector …

The evolution of elastic strain engineering in nanostructures and devices requires
characterization tools that can be used to not only observe but also quantify the actual strain …

A quantitative microstructural analysis is presented for pure polycrystalline nickel (99.99%)
cold rolled to reductions from 70 to 98%(εvM 1.4–4.5). Applying transmission electron …

In this paper, we demonstrate that the shift between similar features in two electron
backscatter diffraction (EBSD) patterns can be measured using cross-correlation based …

This book covers the fundamentals of conventional transmission electron microscopy
(CTEM) as applied to crystalline solids. Complete with over 300 line diagrams and half tones …

Much of this book was written during a sabbatical visit by JCHS to the Max Planck Institute in
Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for …

Image simulation for scanning transmission electron microscopy at atomic resolution for
samples with realistic dimensions can require very large computation times using existing …

Nanoscale strain map** by four-dimensional scanning transmission electron microscopy
(4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a …

Convergent beam electron diffraction (CBED), nano-beam electron diffraction (NBED or
NBD), high resolution imaging (HRTEM and HRSTEM) and dark field electron holography …