New insight to the role of edges and heteroatoms in nanocarbons for oxygen reduction reaction

Q Yang, Z **ao, D Kong, T Zhang, X Duan, S Zhou… - Nano Energy, 2019 - Elsevier
Oxygen reduction reaction (ORR) is the cornerstone for clean and sustainable energy
conversion/storage technologies, depending on effective and robust catalysts. In the rational …

Graphene-based soft wearable antennas

I Ibanez-Labiano, MS Ergoktas, C Kocabas… - Applied Materials …, 2020 - Elsevier
Electronic textiles (e-textiles) are about to face tremendous environmental and resource
challenges due to the complexity of sorting, the risk to supplies and metal contamination in …

Interfacial Superconductivity in FeSe Ultrathin Films on Probed by In Situ Independently Driven Four-Point-Probe Measurements

AK Pedersen, S Ichinokura, T Tanaka, R Shimizu… - Physical Review Letters, 2020 - APS
We investigated the superconducting transport properties of the one-unit-cell FeSe ultrathin
films epitaxially grown on undoped SrTiO 3 (001)(STO) with a well-defined surface structure …

Probing superconducting granularity using nonlocal four-probe measurements

M Poláčková, E Zhitlukhina, M Belogolovskii… - The European Physical …, 2023 - Springer
The four-point probe is a relatively simple method of measuring thin-layer surface resistance
using separate pairs of current-carrying and voltage-sensing contacts. This approach makes …

Electrical resistivity measurements of surface-coated copper foils

J Ni, Z Yan, Y Liu, J Wang - Materials, 2024 - mdpi.com
Due to the direct contact between the probe and sample, the contact of the four-probe
method is important for the structural integrity of the sample and the accuracy of electrical …

High-precision thickness measurement of Cu film on Si-based wafer using erasable printed eddy current coil and high-sensitivity associated circuit techniques

Z Qu, W Wang, Z Yang, Q Bao… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
The eddy current coil is widely adopted to measure the thickness of copper (Cu) film on the
silicon (Si) based wafer. However, the lift-off distance (LOD) variation between the coil and …

Wrinkle-induced highly conductive channels in graphene on SiO 2/Si substrates

RS Ma, J Ma, J Yan, L Wu, W Guo, S Wang, Q Huan… - Nanoscale, 2020 - pubs.rsc.org
A graphene wrinkle is a quasi-one-dimensional structure and can alter the intrinsic physical
and chemical activity, modify the band structure and introduce transport anisotropy in …

Measurement and error analysis of Cu film thickness with Ta barrier layer on wafer for CMP application

Z Qu, W Wang, X Li, Q Li… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Accurate thickness measurement of copper (Cu) film on silicon (Si)-based wafers is very
important in the chemical mechanical polishing (CMP) process. For thickness measurement …

Electrical Characterization of Semiconductors: IV, CV and Hall Measurements

A Azarov, A Hallén, HH Radamson - Analytical Methods and Instruments …, 2023 - Springer
This chapter presents characterization techniques to study the electrical properties of
semiconductors. For electrical measurements, a good metal–semiconductor contact is …

Inhomogeneous Resistivity of Transparent Superconductor Films Revealed by the Van Der Pauw Technique.

A Shapovalov, D Menesenko… - Metallophysics & …, 2024 - search.ebscohost.com
Detection of structural and transport inhomogeneities in superconducting thin films using the
standard four-probe method requires multiple measurements and may be inaccurate. A new …