Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
New insight to the role of edges and heteroatoms in nanocarbons for oxygen reduction reaction
Q Yang, Z **ao, D Kong, T Zhang, X Duan, S Zhou… - Nano Energy, 2019 - Elsevier
Oxygen reduction reaction (ORR) is the cornerstone for clean and sustainable energy
conversion/storage technologies, depending on effective and robust catalysts. In the rational …
conversion/storage technologies, depending on effective and robust catalysts. In the rational …
Graphene-based soft wearable antennas
Electronic textiles (e-textiles) are about to face tremendous environmental and resource
challenges due to the complexity of sorting, the risk to supplies and metal contamination in …
challenges due to the complexity of sorting, the risk to supplies and metal contamination in …
Interfacial Superconductivity in FeSe Ultrathin Films on Probed by In Situ Independently Driven Four-Point-Probe Measurements
We investigated the superconducting transport properties of the one-unit-cell FeSe ultrathin
films epitaxially grown on undoped SrTiO 3 (001)(STO) with a well-defined surface structure …
films epitaxially grown on undoped SrTiO 3 (001)(STO) with a well-defined surface structure …
Probing superconducting granularity using nonlocal four-probe measurements
The four-point probe is a relatively simple method of measuring thin-layer surface resistance
using separate pairs of current-carrying and voltage-sensing contacts. This approach makes …
using separate pairs of current-carrying and voltage-sensing contacts. This approach makes …
Electrical resistivity measurements of surface-coated copper foils
J Ni, Z Yan, Y Liu, J Wang - Materials, 2024 - mdpi.com
Due to the direct contact between the probe and sample, the contact of the four-probe
method is important for the structural integrity of the sample and the accuracy of electrical …
method is important for the structural integrity of the sample and the accuracy of electrical …
High-precision thickness measurement of Cu film on Si-based wafer using erasable printed eddy current coil and high-sensitivity associated circuit techniques
Z Qu, W Wang, Z Yang, Q Bao… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
The eddy current coil is widely adopted to measure the thickness of copper (Cu) film on the
silicon (Si) based wafer. However, the lift-off distance (LOD) variation between the coil and …
silicon (Si) based wafer. However, the lift-off distance (LOD) variation between the coil and …
Wrinkle-induced highly conductive channels in graphene on SiO 2/Si substrates
A graphene wrinkle is a quasi-one-dimensional structure and can alter the intrinsic physical
and chemical activity, modify the band structure and introduce transport anisotropy in …
and chemical activity, modify the band structure and introduce transport anisotropy in …
Measurement and error analysis of Cu film thickness with Ta barrier layer on wafer for CMP application
Z Qu, W Wang, X Li, Q Li… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Accurate thickness measurement of copper (Cu) film on silicon (Si)-based wafers is very
important in the chemical mechanical polishing (CMP) process. For thickness measurement …
important in the chemical mechanical polishing (CMP) process. For thickness measurement …
Electrical Characterization of Semiconductors: I–V, C–V and Hall Measurements
This chapter presents characterization techniques to study the electrical properties of
semiconductors. For electrical measurements, a good metal–semiconductor contact is …
semiconductors. For electrical measurements, a good metal–semiconductor contact is …
Inhomogeneous Resistivity of Transparent Superconductor Films Revealed by the Van Der Pauw Technique.
Detection of structural and transport inhomogeneities in superconducting thin films using the
standard four-probe method requires multiple measurements and may be inaccurate. A new …
standard four-probe method requires multiple measurements and may be inaccurate. A new …