A review of InP/InAlAs/InGaAs based transistors for high frequency applications
This paper presents an overview of the rapid progress being made in the development of
InP based devices for high speed applications. Over the past few decades, major aero …
InP based devices for high speed applications. Over the past few decades, major aero …
Nanometer-Scale III-V MOSFETs
JA Del Alamo, DA Antoniadis, J Lin… - IEEE Journal of the …, 2016 - ieeexplore.ieee.org
After 50 years of Moore's Law, Si CMOS, the mainstream logic technology, is on a course of
diminishing returns. The use of new semiconductor channel materials with improved …
diminishing returns. The use of new semiconductor channel materials with improved …
Scaling of GaN HEMTs and Schottky diodes for submillimeter-wave MMIC applications
K Shinohara, DC Regan, Y Tang… - … on Electron Devices, 2013 - ieeexplore.ieee.org
In this paper, we report state-of-the-art high frequency performance of GaN-based high
electron mobility transistors (HEMTs) and Schottky diodes achieved through innovative …
electron mobility transistors (HEMTs) and Schottky diodes achieved through innovative …
Record Maximum Transconductance of 3.45 mS/ for III-V FETs
This letter presents a self-aligned InGaAs quantum-well MOSFET with a transconductance,
gm, max, of 3.45 mS/μm at V ds= 0.5 V. This is a record value among III-V FETs of any kind …
gm, max, of 3.45 mS/μm at V ds= 0.5 V. This is a record value among III-V FETs of any kind …
III-V/Ge MOS device technologies for low power integrated systems
CMOS utilizing high mobility III-V/Ge channels on Si substrates is expected to be one of the
promising devices for high performance and low power integrated systems in the future …
promising devices for high performance and low power integrated systems in the future …
High-Frequency Performance of Self-Aligned Gate-Last Surface Channel MOSFET
M Egard, L Ohlsson, M Arlelid… - IEEE Electron …, 2012 - ieeexplore.ieee.org
We have developed a self-aligned L g= 55 nm In 0.53 Ga 0.47 As MOSFET incorporating
metal-organic chemical vapor deposition regrown n++ In 0.53 Ga 0.47 As source and drain …
metal-organic chemical vapor deposition regrown n++ In 0.53 Ga 0.47 As source and drain …
Off-state leakage induced by band-to-band tunneling and floating-body bipolar effect in InGaAs quantum-well MOSFETs
J Lin, DA Antoniadis… - IEEE Electron Device …, 2014 - ieeexplore.ieee.org
The physics of off-state drain leakage (I off) in scaled self-aligned InGaAs quantum-well
(QW) MOSFETs is investigated through experiments and simulations. Excess I off is …
(QW) MOSFETs is investigated through experiments and simulations. Excess I off is …
III-V gate-all-around nanowire MOSFET process technology: From 3D to 4D
In this paper, we have experimentally demonstrated, for the first time, III-V 4D transistors with
vertically stacked InGaAs nanowire (NW) channels and gate-all-around (GAA) architecture …
vertically stacked InGaAs nanowire (NW) channels and gate-all-around (GAA) architecture …
Impact of intrinsic channel scaling on InGaAs quantum-well MOSFETs
J Lin, DA Antoniadis… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
Using a novel gate-last process scheme that affords precise channel thickness control, we
have fabricated self-aligned InGaAs quantum-well (QW) MOSFETs. Devices with a channel …
have fabricated self-aligned InGaAs quantum-well (QW) MOSFETs. Devices with a channel …
Ultimate nano-electronics: New materials and device concepts for scaling nano-electronics beyond the Si roadmap
In this work, we will give an overview of the innovations in materials and new device
concepts that will be needed to continue Moore's law to the sub-10 nm technology nodes. To …
concepts that will be needed to continue Moore's law to the sub-10 nm technology nodes. To …