A review of InP/InAlAs/InGaAs based transistors for high frequency applications

J Ajayan, D Nirmal - Superlattices and Microstructures, 2015 - Elsevier
This paper presents an overview of the rapid progress being made in the development of
InP based devices for high speed applications. Over the past few decades, major aero …

Nanometer-Scale III-V MOSFETs

JA Del Alamo, DA Antoniadis, J Lin… - IEEE Journal of the …, 2016 - ieeexplore.ieee.org
After 50 years of Moore's Law, Si CMOS, the mainstream logic technology, is on a course of
diminishing returns. The use of new semiconductor channel materials with improved …

Scaling of GaN HEMTs and Schottky diodes for submillimeter-wave MMIC applications

K Shinohara, DC Regan, Y Tang… - … on Electron Devices, 2013 - ieeexplore.ieee.org
In this paper, we report state-of-the-art high frequency performance of GaN-based high
electron mobility transistors (HEMTs) and Schottky diodes achieved through innovative …

Record Maximum Transconductance of 3.45 mS/ for III-V FETs

J Lin, X Cai, Y Wu, DA Antoniadis… - IEEE Electron Device …, 2016 - ieeexplore.ieee.org
This letter presents a self-aligned InGaAs quantum-well MOSFET with a transconductance,
gm, max, of 3.45 mS/μm at V ds= 0.5 V. This is a record value among III-V FETs of any kind …

III-V/Ge MOS device technologies for low power integrated systems

S Takagi, M Noguchi, M Kim, SH Kim, CY Chang… - Solid-State …, 2016 - Elsevier
CMOS utilizing high mobility III-V/Ge channels on Si substrates is expected to be one of the
promising devices for high performance and low power integrated systems in the future …

High-Frequency Performance of Self-Aligned Gate-Last Surface Channel MOSFET

M Egard, L Ohlsson, M Arlelid… - IEEE Electron …, 2012 - ieeexplore.ieee.org
We have developed a self-aligned L g= 55 nm In 0.53 Ga 0.47 As MOSFET incorporating
metal-organic chemical vapor deposition regrown n++ In 0.53 Ga 0.47 As source and drain …

Off-state leakage induced by band-to-band tunneling and floating-body bipolar effect in InGaAs quantum-well MOSFETs

J Lin, DA Antoniadis… - IEEE Electron Device …, 2014 - ieeexplore.ieee.org
The physics of off-state drain leakage (I off) in scaled self-aligned InGaAs quantum-well
(QW) MOSFETs is investigated through experiments and simulations. Excess I off is …

III-V gate-all-around nanowire MOSFET process technology: From 3D to 4D

JJ Gu, XW Wang, J Shao, AT Neal… - 2012 International …, 2012 - ieeexplore.ieee.org
In this paper, we have experimentally demonstrated, for the first time, III-V 4D transistors with
vertically stacked InGaAs nanowire (NW) channels and gate-all-around (GAA) architecture …

Impact of intrinsic channel scaling on InGaAs quantum-well MOSFETs

J Lin, DA Antoniadis… - IEEE Transactions on …, 2015 - ieeexplore.ieee.org
Using a novel gate-last process scheme that affords precise channel thickness control, we
have fabricated self-aligned InGaAs quantum-well (QW) MOSFETs. Devices with a channel …

Ultimate nano-electronics: New materials and device concepts for scaling nano-electronics beyond the Si roadmap

N Collaert, A Alian, H Arimura, G Boccardi… - Microelectronic …, 2015 - Elsevier
In this work, we will give an overview of the innovations in materials and new device
concepts that will be needed to continue Moore's law to the sub-10 nm technology nodes. To …