STT-MRAM sensing: a review

T Na, SH Kang, SO Jung - … on Circuits and Systems II: Express …, 2020 - ieeexplore.ieee.org
This brief presents a review of developments in spin-transfer-torque magnetoresistive
random access memory (STT-MRAM) sensing over the past 20 years from a circuit design …

Design and Analysis of Modified Pre-Charge Sensing Circuit for STT-MRAM

GP Devaraj, R Kabilan, JZ Gabriel… - … and Virtual Mobile …, 2021 - ieeexplore.ieee.org
A non-volatile memory designed to FLASH recollections and switch SRAM seems to be the
Magnetic RAM (MRAM) proximity unit. Due to its inherent radiation hardness, Spin Transfer …

Offset-canceling current-sampling sense amplifier for resistive nonvolatile memory in 65 nm CMOS

T Na, B Song, JP Kim, SH Kang… - IEEE Journal of Solid …, 2016 - ieeexplore.ieee.org
Resistive nonvolatile memory (NVM) is considered to be a leading candidate for next-
generation memory. However, maintaining a target sensing margin is a challenge with …

Survey of STT-MRAM cell design strategies: Taxonomy and sense amplifier tradeoffs for resiliency

S Salehi, D Fan, RF Demara - ACM Journal on Emerging Technologies …, 2017 - dl.acm.org
Spin-Transfer Torque Random Access Memory (STT-MRAM) has been explored as a post-
CMOS technology for embedded and data storage applications seeking non-volatility, near …

Design of a fast and low-power sense amplifier and writing circuit for high-speed MRAM

H Lee, JG Alzate, R Dorrance, XQ Cai… - IEEE Transactions …, 2014 - ieeexplore.ieee.org
A high-speed and low-power preread and write sense amplifier (PWSA) is presented for
magnetoresistive RAM (MRAM). The sense amplifier incorporates a writing circuit for MRAM …

An embedded level-shifting dual-rail SRAM for high-speed and low-power cache

TH Kim, H Jeong, J Park, H Kim, T Song… - IEEE Access, 2020 - ieeexplore.ieee.org
An embedded level-shifting (ELS) dual-rail SRAM is proposed to enhance the availability of
dual-rail SRAMs. Although dual-rail SRAM is a powerful solution for satisfying the increasing …

Variation-tolerant and disturbance-free sensing circuit for deep nanometer STT-MRAM

W Kang, Z Li, JO Klein, Y Chen, Y Zhang… - IEEE Transactions …, 2014 - ieeexplore.ieee.org
This paper presents a high reliability sensing circuit for the deep nanometer spin-transfer
torque magnetic random-access memory (STT-MRAM). This sensing circuit, using a triple …

Reference-scheme study and novel reference scheme for deep submicrometer STT-RAM

T Na, J Kim, JP Kim, SH Kang… - IEEE Transactions on …, 2014 - ieeexplore.ieee.org
As technology scales down, the sensing margin of spin-transfer-torque random access
memory is significantly degraded because of the increased process variation and decreased …

A dual-domain dynamic reference sensing for reliable read operation in SOT-MRAM

J Kim, Y Jang, T Kim, J Park - IEEE Transactions on Circuits and …, 2022 - ieeexplore.ieee.org
Although spin orbit torque magnetic random access memory (SOT-MRAM) is one of the
strong candidates for next-generation embedded memories, the degradation of read margin …

Dynamic dual-reference sensing scheme for deep submicrometer STT-MRAM

W Kang, T Pang, W Lv, W Zhao - IEEE Transactions on Circuits …, 2016 - ieeexplore.ieee.org
As process technology downscales, read reliability has become a critical barrier for spin
transfer torque magnetic random access memory (STT-MRAM), owing to the increasing …