Atom probe tomography: A local probe for chemical bonds in solids

O Cojocaru‐Mirédin, Y Yu, J Köttgen… - Advanced …, 2024 - Wiley Online Library
Atom probe tomography is frequently employed to characterize the elemental distribution in
solids with atomic resolution. Here the potential of this technique to locally probe chemical …

Real-time TEM observation of the role of defects on nickel silicide propagation in silicon nanowires

TE Adegoke, R Bekarevich, H Geaney… - ACS …, 2024 - ACS Publications
Metal silicides have received significant attention due to their high process compatibility, low
resistivity, and structural stability. In nanowire (NW) form, they have been widely prepared …

Compared microstructure and properties of an AlZnMgCu alloy processed by high pressure sliding and high-pressure torsion

A Duchaussoy, X Sauvage, A Deschamps… - Journal of Alloys and …, 2023 - Elsevier
Achieving high yield strength via submicrometer grain size and nanoscaled precipitation has
been reached in 7### aluminum alloys thanks to severe plastic deformation (SPD) by High …

Complex interactions between precipitation, grain growth and recrystallization in a severely deformed Al-Zn-Mg-Cu alloy and consequences on the mechanical …

A Duchaussoy, X Sauvage, A Deschamps… - Materialia, 2021 - Elsevier
Combining submicrometer grain size with nanoscaled precipitation is an attractive approach
to achieve high yield stress with reasonable ductility in aluminum alloys. The control of super …

Microstructural evolution of U (Mo)–Al (Si) dispersion fuel under irradiation–Destructive analyses of the LEONIDAS E-FUTURE plates

A Leenaers, S Van den Berghe, J Van Eyken… - Journal of nuclear …, 2013 - Elsevier
Several irradiation experiments have confirmed the positive effect of adding Si to the matrix
of an U (Mo) dispersion fuel plate on its in-pile irradiation behavior. E-FUTURE, the first …

Effect of Pt addition on Ni silicide formation at low temperature: Growth, redistribution, and solubility

K Hoummada, C Perrin-Pellegrino… - Journal of Applied …, 2009 - pubs.aip.org
The formation of Ni silicide during the reaction between Ni (5% Pt) and a Si (100) substrate
has been analyzed by differential scanning calorimetry (DSC), in situ x-ray diffraction (XRD) …

Redistribution of Pt during the agglomeration of NiSi

D Mangelinck, FM Anak, K Dabertrand, S Guillemin… - Acta Materialia, 2025 - Elsevier
Due to the constant downscaling of microelectronic devices, thin films of Ni-Pt monosilicide,
Ni (Pt) Si, are widely used as contact materials on the active regions of complementary metal …

Three-dimensional composition map** of NiSi phase distribution and Pt diffusion via grain boundaries in Ni2Si

D Mangelinck, K Hoummada, A Portavoce, C Perrin… - Scripta Materialia, 2010 - Elsevier
The formation of Ni silicide alloyed with Pt has been analyzed by atom probe tomography. A
300° C/1h anneal results in simultaneous growth of the NiSi and Ni2Si phases: the Ni2Si …

[KÖNYV][B] Handbook of Solid State Diffusion: Volume 2: Diffusion Analysis in Material Applications

A Paul, S Divinski - 2017 - books.google.com
Handbook of Solid State Diffusion, Volume 2: Diffusion Analysis in Material Applications
covers the basic fundamentals, techniques, applications, and latest developments in the …

Atom-probe tomography of semiconductor materials and device structures

LJ Lauhon, P Adusumilli, P Ronsheim, PL Flaitz… - MRS bulletin, 2009 - cambridge.org
The development of laser-assisted atom-probe tomography (APT) analysis and new sample
preparation approaches have led to significant advances in the characterization of …