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Atom probe tomography: A local probe for chemical bonds in solids
Atom probe tomography is frequently employed to characterize the elemental distribution in
solids with atomic resolution. Here the potential of this technique to locally probe chemical …
solids with atomic resolution. Here the potential of this technique to locally probe chemical …
Real-time TEM observation of the role of defects on nickel silicide propagation in silicon nanowires
Metal silicides have received significant attention due to their high process compatibility, low
resistivity, and structural stability. In nanowire (NW) form, they have been widely prepared …
resistivity, and structural stability. In nanowire (NW) form, they have been widely prepared …
Compared microstructure and properties of an AlZnMgCu alloy processed by high pressure sliding and high-pressure torsion
Achieving high yield strength via submicrometer grain size and nanoscaled precipitation has
been reached in 7### aluminum alloys thanks to severe plastic deformation (SPD) by High …
been reached in 7### aluminum alloys thanks to severe plastic deformation (SPD) by High …
Complex interactions between precipitation, grain growth and recrystallization in a severely deformed Al-Zn-Mg-Cu alloy and consequences on the mechanical …
Combining submicrometer grain size with nanoscaled precipitation is an attractive approach
to achieve high yield stress with reasonable ductility in aluminum alloys. The control of super …
to achieve high yield stress with reasonable ductility in aluminum alloys. The control of super …
Microstructural evolution of U (Mo)–Al (Si) dispersion fuel under irradiation–Destructive analyses of the LEONIDAS E-FUTURE plates
A Leenaers, S Van den Berghe, J Van Eyken… - Journal of nuclear …, 2013 - Elsevier
Several irradiation experiments have confirmed the positive effect of adding Si to the matrix
of an U (Mo) dispersion fuel plate on its in-pile irradiation behavior. E-FUTURE, the first …
of an U (Mo) dispersion fuel plate on its in-pile irradiation behavior. E-FUTURE, the first …
Effect of Pt addition on Ni silicide formation at low temperature: Growth, redistribution, and solubility
The formation of Ni silicide during the reaction between Ni (5% Pt) and a Si (100) substrate
has been analyzed by differential scanning calorimetry (DSC), in situ x-ray diffraction (XRD) …
has been analyzed by differential scanning calorimetry (DSC), in situ x-ray diffraction (XRD) …
Redistribution of Pt during the agglomeration of NiSi
D Mangelinck, FM Anak, K Dabertrand, S Guillemin… - Acta Materialia, 2025 - Elsevier
Due to the constant downscaling of microelectronic devices, thin films of Ni-Pt monosilicide,
Ni (Pt) Si, are widely used as contact materials on the active regions of complementary metal …
Ni (Pt) Si, are widely used as contact materials on the active regions of complementary metal …
Three-dimensional composition map** of NiSi phase distribution and Pt diffusion via grain boundaries in Ni2Si
The formation of Ni silicide alloyed with Pt has been analyzed by atom probe tomography. A
300° C/1h anneal results in simultaneous growth of the NiSi and Ni2Si phases: the Ni2Si …
300° C/1h anneal results in simultaneous growth of the NiSi and Ni2Si phases: the Ni2Si …
[KÖNYV][B] Handbook of Solid State Diffusion: Volume 2: Diffusion Analysis in Material Applications
A Paul, S Divinski - 2017 - books.google.com
Handbook of Solid State Diffusion, Volume 2: Diffusion Analysis in Material Applications
covers the basic fundamentals, techniques, applications, and latest developments in the …
covers the basic fundamentals, techniques, applications, and latest developments in the …
Atom-probe tomography of semiconductor materials and device structures
The development of laser-assisted atom-probe tomography (APT) analysis and new sample
preparation approaches have led to significant advances in the characterization of …
preparation approaches have led to significant advances in the characterization of …